2017
DOI: 10.1016/j.solmat.2017.08.020
|View full text |Cite
|
Sign up to set email alerts
|

Fabrication of high efficiency sputtered CdS:O/CdTe thin film solar cells from window/absorber layer growth optimization in magnetron sputtering

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

2
21
0

Year Published

2018
2018
2023
2023

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 48 publications
(23 citation statements)
references
References 42 publications
2
21
0
Order By: Relevance
“…The results were well supported by the EQE measurement, as shown in Figure D. It is well known that the EQE curve can be divided into two regions, where Region 1 (300‐600 nm) is greatly dependent on carrier generation, transport, and recombination near the p‐n junction region, whereas Region 2 (600 nm and above) corresponds to the effective transport of photogenerated carriers at the bulk and back contact of solar cells . The EQE in Region 1 was reduced for the PID‐affected module owing to the elevation of carrier recombination at the front side of the solar cell dominated by surface defects.…”
Section: Resultssupporting
confidence: 65%
See 1 more Smart Citation
“…The results were well supported by the EQE measurement, as shown in Figure D. It is well known that the EQE curve can be divided into two regions, where Region 1 (300‐600 nm) is greatly dependent on carrier generation, transport, and recombination near the p‐n junction region, whereas Region 2 (600 nm and above) corresponds to the effective transport of photogenerated carriers at the bulk and back contact of solar cells . The EQE in Region 1 was reduced for the PID‐affected module owing to the elevation of carrier recombination at the front side of the solar cell dominated by surface defects.…”
Section: Resultssupporting
confidence: 65%
“…It is well known that the EQE curve can be divided into two regions, where Region 1 (300-600 nm) is greatly dependent on carrier generation, transport, and recombination near the p-n junction region, whereas Region 2 (600 nm and above) corresponds to the effective transport of photogenerated carriers at the bulk and back contact of solar cells. 40,41 The EQE in Region 1 was reduced for the PID-affected module owing to the elevation of carrier recombination at the front side of the solar cell dominated by surface defects. On the other hand, the increases of carrier recombination at the bulk of p-type Si base due to the increase of uncompensated Si bonds influenced by PID in the devices may be the root causes for the decrease of EQEs in Region 2.…”
Section: Methodsmentioning
confidence: 99%
“…The highest sulfur-to-tungsten ratio (1: 1.55) was found at 200 W deposition power. Grain size was calculated with ImageJ software 29 , and the results revealed that grain size increased with the deposition power. The highest grain size of 76.25 nm was found at 150 W deposition power, whereas the lowest of 4.86 nm was found at 50 W deposition power.…”
Section: Resultsmentioning
confidence: 99%
“…Full device fabrication included the stack of five layers, namely, indium tin oxide (ITO) for the transparent conducting oxide, the n-type WS 2 window layer, the p-type absorber CdTe, Cu-doped graphite paste for improved ohmic contact, and silver (Ag) as back contact. The complete cell was fabricated by sputtering as reported by previous researchers 29 . Figure 1 represents the structure and full cell device fabrication process.…”
Section: Full Device Fabrication the Optimized Ws 2 Thin Film Was Inmentioning
confidence: 99%
“…Particularly, using HRT materials as a buffer layer beneath of the cadmium sulfide (CdS) layers in cadmium telluride (CdTe), copper-indium-gallium-selenide (CIGS) and copperzinc-tin-sulfide (CZTS) thin-film solar cells can significantly ameliorate the pin-hole problem that is created due to the ultrathin CdS layer ((≤100 nm). In general, the ultra-thin CdS layer is being used in these solar cells for minimizing the considerable absorption in the blue region by CdS thin film [1][2][3]. However, the ultra-thin CdS layer adversely affects the cell efficiency via increasing pin-hole (discontinuity) and locally shorted the absorber material with TCO and front contact, which leads to excessive shunting or unwarranted forward current, and therefore negatively affects the solar cell efficiency [4].…”
Section: Introductionmentioning
confidence: 99%