2021
DOI: 10.1002/smtd.202101030
|View full text |Cite
|
Sign up to set email alerts
|

Fabrication of Large‐Area Uniform Nanometer‐Thick Functional Layers and Their Stacks for Flexible Quantum Dot Light‐Emitting Diodes

Abstract: Large‐area fabrication and stacking of various nanometer‐thick functional layers from solutions is essentially important for the construction of flexible thin‐film optoelectronic devices, but very challenging. The existing fabrication methods suffer from either non‐uniformity caused by the coffee‐ring effect or serious solution waste (excess of 90% for spin coating), and are hard to scale up and create stacks. Here, it is shown that centrifugal casting is a universal, scalable, and efficient method to fabricat… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
4

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 45 publications
0
3
0
Order By: Relevance
“…Our devices show a high maximum EQE of over 14% and a maximum brightness of 624,000 cd/m 2 at 12 V, unprecedented for QLEDs fabricated under ambient-air conditions (see, e.g., Ref. 37 ) 38 . We have experimentally investigated the temperature-dependent efficiency parameters and brightness by stressing the devices under multiple cooling/heating cycles within a wide temperature range from − 10 to 85 °C.…”
Section: Introductionmentioning
confidence: 81%
“…Our devices show a high maximum EQE of over 14% and a maximum brightness of 624,000 cd/m 2 at 12 V, unprecedented for QLEDs fabricated under ambient-air conditions (see, e.g., Ref. 37 ) 38 . We have experimentally investigated the temperature-dependent efficiency parameters and brightness by stressing the devices under multiple cooling/heating cycles within a wide temperature range from − 10 to 85 °C.…”
Section: Introductionmentioning
confidence: 81%
“…On the other hand, numerous research papers have reported QLED devices fabricated by the traditional “inkjet printing”, [ 5 ] “blade coating”, [ 6 ] “direct writing”, [ 7 ] “pen writing”, [ 8 ] “solution transferring”, [ 9 ] “selective electrophoretic deposition”, [ 10 ] and “centrifugal casting”. [ 11 ]…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, numerous research papers have reported QLED devices fabricated by the traditional "inkjet printing", [5] "blade coating", [6] "direct writing", [7] "pen writing", [8] "solution transferring", [9] "selective electrophoretic deposition", [10] and "centrifugal casting". [11] Due to its high electron mobility and excellent energy-level alignment with the conduction band minimum (CBM) of CdSe-based QDs in the emissive layer (EML), [12] zinc oxide (ZnO) has been established as the most widely used electron transport layer (ETL) in QLED architectures. The small energy barrier for electron injection (from the ETL to EML), together with a large energy offset between the hole transport layer (HTL) and EML could cause a charge imbalance in a QLED device.…”
Section: Introductionmentioning
confidence: 99%