Fabrication of Nanostructured Objects by Thermal Vacuum Deposition of Ge Films onto (100)GaAs Substrates

Abstract

The technique of thermal vacuum deposition of Ge onto GaAs substrates has been used for obtaining nanocrystalline Ge films. Nanocrystalline character of the films is confirmed by atomic force microscopy of their surface and by the data of Raman light scattering. The most probable size of the nanocrystallites forming the films decreases monotonically with decreasing their thickness. And raise of the deposition temperature results in their enlargement. Electro conductivity of such films proves to be high enough (resistivity of 1-10 Ohm cm at room temperature) and has character of variable range hopping conduction of the Mott's type. The hops, presumably, take place through the localized states connected with the grain boundaries.

Development of Hot Equal Channel Angular Processing (ECAP) Consolidation Technique in the Production of Boron Carbide(B4C)-Reinforced Aluminium Chip (AA6061)-Based Composite

“…B4C/Al respectively. It is confirmed that the grain size enlargement and film thickness increases of the investigated samples are Borblik et al (2016) proposed that the decreases in the film thickness result in decreases of all scales characteristics of the material surface relief. Luce et al (Luce n.d.) reported that AFM could be used to analyse different sizes and types of images surface topography with easy sample preparation that is started from the nano-or microscale of the magnetic thin films.…”

The Effect of Solid-State Processes and Heat Treatment on the Properties of AA7075 Aluminum Waste Recycling Nanocomposite

“…Borblik et al [19] proposed that the decreases in the size of sample resulted in decreases in all characteristics of the material surface. Luce et al [20] reported the use of AFM to analyse sizes and other important characteristics for surface topography with ease in Materials 2021, 14 Borblik et al [19] proposed that the decreases in the size of sample resulted in decreases in all characteristics of the material surface.…”

“…Borblik et al [19] proposed that the decreases in the size of sample resulted in decreases in all characteristics of the material surface. Luce et al [20] reported the use of AFM to analyse sizes and other important characteristics for surface topography with ease in Materials 2021, 14 Borblik et al [19] proposed that the decreases in the size of sample resulted in decreases in all characteristics of the material surface. Luce et al [20] reported the use of AFM to analyse sizes and other important characteristics for surface topography with ease in Materials 2021, 14 Borblik et al [19] proposed that the decreases in the size of sample resulted in decreases in all characteristics of the material surface.…”

“…Luce et al [20] reported the use of AFM to analyse sizes and other important characteristics for surface topography with ease in Materials 2021, 14 Borblik et al [19] proposed that the decreases in the size of sample resulted in decreases in all characteristics of the material surface. Luce et al [20] reported the use of AFM to analyse sizes and other important characteristics for surface topography with ease in Materials 2021, 14 Borblik et al [19] proposed that the decreases in the size of sample resulted in decreases in all characteristics of the material surface. Luce et al [20] reported the use of AFM to analyse sizes and other important characteristics for surface topography with ease in sample preparation for nano or microscales of the magnetic thin films.…”

Recycling Aluminium AA6061 Chips with Reinforced Boron Carbide (B4C) and Zirconia (ZrO2) Particles via Hot Extrusion

“…The thin films kept decreasing all the grain's length as the root mean square because of the enlargement added particles time growth. Thus, the decrease in the film's thickness causes a decrease in the surface of the hybrid material characterisations [45].…”