Abstract:We investigate the effect of boron (B) catalytic impurity doping (Cat-doping), a low-temperature doping method by exposing to catalytically generated dopant radicals, on hydrogenated amorphous silicon (a-Si:H) films and the influence of the electrical properties of indium tin oxide (ITO) films on the tunneling conduction of carriers through the ITO/a-Si:H interfaces. The usage of ITO films with higher carrier density and B Cat-doped a-Si:H films formed with the addition of H2 enhances carrier tunneling through… Show more
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