2012
DOI: 10.1149/2.011202ssl
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Fabrication of Vertical-Structured GaN-Based Light-Emitting Diodes Using Auto-Split Laser Lift-Off Technique

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Cited by 5 publications
(7 citation statements)
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“…There is a common feature in the observed fracture of the freestanding films shown in Fig. 2 and in our previous work [30]. It is that the cracking pattern is very similar to Bceramic fragmentation[, indicating that the properties of GaN film are consistent with that of brittle ceramic materials [32].…”
Section: Resultssupporting
confidence: 76%
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“…There is a common feature in the observed fracture of the freestanding films shown in Fig. 2 and in our previous work [30]. It is that the cracking pattern is very similar to Bceramic fragmentation[, indicating that the properties of GaN film are consistent with that of brittle ceramic materials [32].…”
Section: Resultssupporting
confidence: 76%
“…According to Tavernier's work [35] and our previous work [30], [36], the vaporization pressure of N 2 is exponentially proportional to the laser energy density. Moreover, the number of the dislocations in the freestanding film increases with the mesa spacing.…”
Section: Resultsmentioning
confidence: 82%
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“…On the other hand, wafer-scale device transfer processes and film transfer processes have been developed to integrate functional elements on desirable substrates by using laser debonding techniques such as the so-called laser transfer process (LTP) and laser lift-off (LLO) [12][13][14][15][16][17][18][19][20][21]. For example, AFM cantilevers were transferred from one source wafer to 42 destination wafers [12].…”
Section: Introductionmentioning
confidence: 99%