E-beam deposition was used to deposit Al 2 O 3 and TiO 2 single-layer films onto glass substrates at 300 °C, with 6 sccm O 2 being introduced during the deposition process. Optical characterization of the films was conducted to evaluate whether the thickness was suitable for the formation of multipair reflective coatings. The refractive indices of the films measured at an optical wavelength of 450 nm were 1.742 (Al 2 O 3 ) and 2.206 (TiO 2 ). E-beam deposition was then used to deposit Al 2 O 3 − TiO 2 bilayer films in one, two, four, and six periods on glass substrates to fabricate multilayer films as broadband Bragg-reflecting coatings for blue light. The thicknesses of the Al 2 O 3 and TiO 2 films for the quarter wave condition were 51 and 64 nm, respectively. When one period of Al 2 O 3 −TiO 2 bilayer film was deposited on the glass substrate, the film had high transparency, and no reflective effect was observed. As two, four, and six periods were deposited on the glass substrates, the Bragg reflection effect became apparent. The reflectance ratio also increased with the number of periods. Cross-sectional observations showed that each Al 2 O 3 and TiO 2 film could be deposited well on glass substrates using E-beam deposition. The thicknesses of the Al 2 O 3 and TiO 2 films would have deviations to achieve an expected value, causing variations in the central frequency and bandwidth of the Bragg reflection effect for the Al 2 O 3 −TiO 2 bilayer films. We theorize as to why deviations in the films' thicknesses caused differences between (i) the theoretical and measured reflective spectra and (ii) the theoretical and measured central frequency and bandwidth values.