Monte Carlo simulation is used to investigate the fluctuations in the Xe proportional electroluminescence (EL) yield H (also known as secondary scintillation) produced by subionization primary electrons drifting in the gas under appropriate electric fields, comparing pure Xe gas with Xe doped with CH 4 or CF 4 . The work is modeled on gas detectors of the gas proportional-scintillation type, where amplification is achieved through the production of EL under a charge-multiplication free regime. The addition of the molecular gases to Xe reduces electron diffusion, a desirable effect in large size detectors where primary electrons drift across a long absorption/drift region. However, the presence of the molecules reduces H and increases its fluctuations. In the case of CF 4 , the effects are very strong due to significant electron attachment in the EL field range, ruling out CF 4 as an acceptable additive. The addition of CH 4 affects H and its fluctuations to a much lower extent, and CH 4 concentrations lower than ~1% may be an appropriate choice. In addition, Monte Carlo calculations in pure Xe under cylindrical geometry in a regime below charge multiplication have shown that fluctuations in the EL yield H are an order of magnitude higher than for planar geometry. For both geometries, though, the fluctuations have a negligible effect on the energy resolution, and variations of the anode radius in cylindrical geometry or grid parallelism in planar geometry may be a more significant cause of concern.