A robust metal-free intracavity fixed-wavelength selector for the cryogenically cooled far-infrared p-Ge laser is demonstrated. The device is a back mirror consisting of a thin silicon etalon and dielectric SrTiO 3 flat. A laser line width of 0.2 cm Ϫ1 is achieved, which corresponds to an active cavity finesse of ϳ0.15. The wavelength position and spectral purity are maintained over a wide range of laser operating fields. Use of SrTiO 3 lowers the laser resonance line frequencies by ϳ1 cm Ϫ1 compared with expectations for metal mirrors. The effect is due to phase shift, which is determined from far-infrared reflectivity measurements of SrTiO 3. A p-Ge laser with such selector is free from danger of electrical breakdown and mirror oxidation during repeatable thermal cycling, which makes it more reliable than previous selection schemes for practical applications.