2009
DOI: 10.1016/j.sna.2008.12.024
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Far-infrared sensor with LPCVD-deposited low-stress Si-rich nitride absorber membrane

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Cited by 19 publications
(5 citation statements)
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“…The spectrum of the transmittance, T , is measured. The absorption spectrum, A , is then directly extracted from the following expression 50 : A = 1-T-R , assuming the total reflectivity ( R ) from the sample in the LWIR is around 5% 51 .…”
Section: Methodsmentioning
confidence: 99%
“…The spectrum of the transmittance, T , is measured. The absorption spectrum, A , is then directly extracted from the following expression 50 : A = 1-T-R , assuming the total reflectivity ( R ) from the sample in the LWIR is around 5% 51 .…”
Section: Methodsmentioning
confidence: 99%
“…Due to the good thermal conduction and IR absorption of the boron heavily doped silicon slab, the thermopile structure with boron heavily doped silicon slabs as the IR absorber has also been demonstrated [13,14]. Recently, the experimental work of Lenggenhager et al [5] and Jutzi et al [15] showed that CMOS dielectric layers can also provide a sufficient IR absorption coefficient for certain spectral bands. Thus, SiO 2 -Si 3 N 4 -SiO 2 sandwich film stack is adopted as the absorber layer in this experimental work.…”
Section: Absorber Designmentioning
confidence: 99%
“…Furthermore, their preparation process is much more complicated and cost is relatively high. A silicon nitride (Si3N4) or silica (SiO2) layer or SiO2/Si3N4/SiO2 sandwich film structure is also often used as the IR absorber of thermopile chip (termed a "membrane" layer), however provides low IR absorption and narrow absorption range [6][7][8].…”
Section: Introductionmentioning
confidence: 99%