Fast and gentle side approach for atomic force microscopy

Abstract

Atomic force microscopy is one of the most popular imaging tools with atomic resolution in different research fields. Here, a fast and gentle side approach for atomic force microscopy is proposed to image the same surface location and to reduce the time delay between modification and imaging without significant tip degradation. This reproducible approach to image the same surface location using atomic force microscopy shortly after, for example, any biological, chemical, or physical modification on a geometrically separated position has the potential to become widely used.

Imaging pulsed laser deposition oxide growth by in situ atomic force microscopy

“…We therefore recorded the time domain signal together with the acceleration levels during such transfer. The vibrational decay time of the mechanical AFM tip-sample loop is determined from the time domain signal from the moment that the transfer stage velocity is zero at the AFM position after sample transfer from PLD position to the AFM position, for more details we refer to our earlier report 25 . In the parallel acceleration level measurements, resonance peaks are observed at 140 and 280 Hz directly after stage deceleration and a corresponding delay time of 0.4 s. The back and forth sample transfer between AFM and PLD is possible in 0.5 s driving at maximum acceleration and velocity.…”

“…A sample heater is mounted on top of a linear motion slider. The concept is such that the side approach 25 can be applied to reduce the time delay between PLD and AFM monitoring of the sample surface. The proposed configuration is straightforward to combine PLD with other diagnostics tools, such as scattering techniques as RHEED and plasma diagnostic tools for an increased understanding of thin film growth in PLD.…”