Fast nanotopography imaging using a high speed cantilever with integrated heater–thermometer

Lee, Byeonghee; Somnath, Suhas; King, William P.

doi:10.1088/0957-4484/24/13/135501

Cited by 6 publications

(9 citation statements)

References 36 publications

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“…Scanning probe techniques play an important role in understanding nanoscale energy conversion and transport. [1][2][3][4] Specifically, scanning thermal microscopy (SThM) has been widely used for local measurements of temperature fields, [5][6][7][8][9][10][11][12][13][14][15][16] thermal conductivity, [17][18][19] thermopower, 20,21 atomic-scale heat dissipation, 3 and even nanoscale thermal lithography. 22,23 In all SThM techniques, a temperature sensor (thermocouple or resistance-based thermometer), which can measure local temperatures and/or generate local heating, is integrated into the probe.…”

mentioning

confidence: 99%

Quantification of thermal and contact resistances of scanning thermal probes

Kim

Jeong

Lee

et al. 2014

Applied Physics Letters

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Scanning thermal probes are widely used for imaging temperature fields with nanoscale resolution, for studying near-field radiative heat transport and for locally heating samples. In all these applications, it is critical to know the thermal resistance to heat flow within the probe and the thermal contact resistance between the probe and the sample. Here, we present an approach for quantifying the aforementioned thermal resistances using picowatt resolution heat flow calorimeters. The measured contact resistance is found to be in good agreement with classical predictions for thermal contact resistance. The techniques developed here are critical for quantitatively probing heat flows at the nanoscale.

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confidence: 99%

Quantification of thermal and contact resistances of scanning thermal probes

Kim

Jeong

Lee

et al. 2014

Applied Physics Letters

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“…172 Details of etching, deposition, and doping fabrication procedures can be reviewed here. [165][166][167] Formerly used solely for data storage and writing, 173 heated AFM cantilevers have since gone through a recent renaissance due to the extensive efforts of the King group, 168,174 who systematically calibrated cantilever heater operation to enable an advanced thermal characterization suite, including thermomechanical data writing, 175 nanoscale solid ink deposition, 176 thermo-mechano-chemical analysis, 177 thermal topographic imaging, [178][179][180] frictional control, 181 and temperature-dependent contact potential measurements. 182 Fig.…”

Section: Heated Microcantileversmentioning

confidence: 99%

A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures

Nonnenmann

2016

Nanoscale

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Accurate high temperature characterization of materials remains a critical challenge to the continued advancement of various important energy, nuclear, electronic, and aerospace applications. Future experimental studies must assist these communities to progress past empiricism and derive deliberate, predictable designs of material classes functioning within active, extreme environments. Successful realization of systems ranging from fuel cells and batteries to electromechanical nanogenerators and turbines requires a dynamic understanding of the excitation, surface-mediated, and charge transfer phenomena which occur at heterophase interfaces (i.e. vapor-solid, liquid-solid, solid-solid) and impact overall performance. Advancing these frontiers therefore necessitates in situ (operando) characterization methods capable of resolving, both spatially and functionally, the coherence between these complex, collective excitations, and their respective response dynamics, through studies within the operating regime. This review highlights recent developments in scanning probe microscopy in performing in situ imaging at high elevated temperatures. The influence of and evolution from vacuum-based electron and tunneling microscopy are briefly summarized and discussed. The scope includes the use of high temperature imaging to directly observe critical phase transition, electronic, and electrochemical behavior under dynamic temperature settings, thus providing key physical parameters. Finally, both challenges and directions in combined instrumentation are proposed and discussed towards the end.

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“…On the contrary, the direct method is a top-down approach wherein tips are formed by micromachining the tip material under an etch mask by dry or wet etching. [8] Dry etching is an expensive technique that requires sophisticated apparatus, [9] whereas the wet etch method uses low-cost chemicals such as tetramethylammonium hydroxide (TMAH), potassium hydroxide (KOH), and hydrofluoric acid, nitric acid, and acetic acid (HNA), [10][11][12] making it a powerful alternative to the dry etch process.…”

Section: Introductionmentioning

confidence: 99%

A Simple Method for Fabrication of Self‐sharpened Silicon Tips for Atomic Force Microscopy Applications

Rudrappa

Venkatramana

Ahmed

et al. 2022

Crystal Research and Technology

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A simple and high yield method is presented for the bulk generation of atomic force microscopy (AFM) probes with self‐sharpened silicon tips. The experimental setup includes a controlled chemical etching environment at a constant temperature with continuous recirculation and filtration. A KOH solution is considered cost‐effective as the etchant and stabilized to the required concentration (55%, v/v) and temperature (40 °C), so as to provide an etch rate of 40 nm min−1 and yield a smooth etch profile. A high density of silicon tips is fabricated, with yield up to 90%, and a consistent tip radius of ≈12.73 ± 1.51 nm. These tips can be successfully integrated with AFM cantilevers, resulting in AFM probes. Further, such AFM‐probes are well characterized using laser Doppler vibrometry and scanning electron microscopy. The result shows a resonance frequency of 1.2–1.4 MHz and a high‐quality factor of ≈708.8. In addition, the AFM probes produced images are comparable in quality to those obtained from commercially available probes.

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Fast nanotopography imaging using a high speed cantilever with integrated heater–thermometer

Cited by 6 publications

References 36 publications

Quantification of thermal and contact resistances of scanning thermal probes

Quantification of thermal and contact resistances of scanning thermal probes

A hot tip: imaging phenomena using in situ multi-stimulus probes at high temperatures

A Simple Method for Fabrication of Self‐sharpened Silicon Tips for Atomic Force Microscopy Applications

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