In order to improve the accordance between measured and calculated energy loss distributions a new tuning method is suggested. The idea is that the oscillator strength function or, equivalently, the dielectric function of the specific medium used in the detector can be extracted from a deconvoluted well measured dE=dx spectrum. This procedure involves rather delicate numerical problems, which will be discussed in detail. The method is in particular suitable for detectors with thin layered sampling (xP < 1 cm) where traditional methods tend to fail due to the difficulties of correcting for detector inefficiencies and smearing. This is illustrated by testing the method on data from a thin layered Time Projection Chamber, TPC.