2010
DOI: 10.1016/j.ijhydene.2010.05.005
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Fast performance degradation of SOFC caused by cathode delamination in long-term testing

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Cited by 109 publications
(49 citation statements)
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“…The addition of 5 wt.% Ag in LSCF-SDCC gives the lowest TEC mismatch with the SDCC electrolyte at the percentage difference of 2.65% (0.34×10 −6 K −1 ) compared to the LSCF-SDCC with 3 wt.% Ag, 1 wt.% Ag and without Ag which yielded a mismatch of 4.36%, 5.14%, and 4.21% respectively. Therefore, in this temperature range and based on this criterion, the LSCF-SDCC-A5 shows the most appropriate matches and potential to improve the performance of LT-SOFC [4].…”
Section: Applied Mechanics and Materials Vols 773-774 447mentioning
confidence: 97%
See 1 more Smart Citation
“…The addition of 5 wt.% Ag in LSCF-SDCC gives the lowest TEC mismatch with the SDCC electrolyte at the percentage difference of 2.65% (0.34×10 −6 K −1 ) compared to the LSCF-SDCC with 3 wt.% Ag, 1 wt.% Ag and without Ag which yielded a mismatch of 4.36%, 5.14%, and 4.21% respectively. Therefore, in this temperature range and based on this criterion, the LSCF-SDCC-A5 shows the most appropriate matches and potential to improve the performance of LT-SOFC [4].…”
Section: Applied Mechanics and Materials Vols 773-774 447mentioning
confidence: 97%
“…A difference in TEC between a cathode and an electrolyte at 7×10 −6 K −1 can result in a 10% chance of delamination occurring at the first 500 h of operational [4]. Therefore, the TEC of perovskite has to be considered and should be matched with the electrolyte to avoid a high mismatch with the electrolyte.…”
Section: Introductionmentioning
confidence: 99%
“…The bonding between solid oxide fuel cell (SOFC) electrodes and metal interconnects is of utmost importance since it may determine overall stack lifetime [1][2][3][4]. Fig.…”
Section: Introductionmentioning
confidence: 99%
“…The bonding between SOC electrodes and metal ICs is a critical issue, which may determine the stack lifetime [1]. An understanding of the bonding mechanism is essential to design successful ICcathode/anode interfaces in SOCs.…”
Section: Introductionmentioning
confidence: 99%