“…In order to solve this problem, different methods have been proposed such as structure light or pattern protection. In these methods, projecting a predefined pattern on an object and comparing the reflected pattern from the object with the pre-defined pattern can be used to extract depth information (Le Moigne & Waxman, 1985); (Morita, Yajima, & Sakata, 1988); (Maruyama & Abe, 1993); (Boyer & Kak, 1987); (Tang & Hung, 1990); (Srinivasan, Liu, & Halioua, 1984). Similar technique can be used in SfM techniques by projecting a very dense and texture-full pattern on the object before capturing the images.…”