Fault diagnosis in designs with convolutional compactors

Mrugalski, Grzegorz; Pogiel, Artur; Rajski, J.; Tyszer, Jerzy; Wang, Chen

doi:10.1109/test.2004.1386986

Cited by 18 publications

(6 citation statements)

References 23 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…This is everything necessary to imply the error bits back into the chains. Note that convolutional compactors [9] provide some similar benefits over pure XOR compactors.…”

Section: Streaming Misr Outputsmentioning

confidence: 99%

Use of MISR Output Streams for Diagnostics

Keller

Bartenstein

IEEE International Conference on Test, 2005.

View full text Add to dashboard Cite

This paper describes a simple means for diagnosing failures by observing a compacted MISR output stream. While MISRs have been used in the industry for response compression, their use has often been seen as an impediment to diagnosis of failures. This paper shows how it is possible to use MISRs to perform a go/no-go failure test with very little data volume and to also use a compacted continuous stream of MISR output states to aid diagnosis.

show abstract

“…This is everything necessary to imply the error bits back into the chains. Note that convolutional compactors [9] provide some similar benefits over pure XOR compactors.…”

Section: Streaming Misr Outputsmentioning

confidence: 99%

Use of MISR Output Streams for Diagnostics

Keller

Bartenstein

IEEE International Conference on Test, 2005.

View full text Add to dashboard Cite

show abstract

“…All techniques implement test data decompression as well as test response compaction on chip. A selection of these techniques can be found in [4,5,6,7,8,9].…”

Section: Introductionmentioning

confidence: 99%

“…Recent investigations have shown that an efficient diagnosis can also be performed using compressed test data instead of the full test data set [9,10]. Moreover, studies have shown that it is sufficient to record only a limited number of fails from a failing device to detect systematic failures [10,11].…”

Section: Introductionmentioning

confidence: 99%

On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture

Poehl

Rzeha

Beck

et al.

Eleventh IEEE European Test Symposium (ETS'06)

View full text Add to dashboard Cite

show abstract

“…There have been several publications on diagnosis in the presence of classical test response compaction structures such as MISRs [5,10]. In the context of diagnostics with test compression, several papers have been published [9,12,14,18,19]. A method for identifying stuck-at faults directly from the compressed test response without identifying failing flip-flops was described in work by Cheng et al [12].…”

Section: Introductionmentioning

confidence: 99%

“…The technique in [18,19] was also used in [14] for diagnosis using convolution compactors. However, the technique in [14] doesn't consider diagnosis in the presence of Xs.…”

Section: Introductionmentioning

confidence: 99%

Enabling yield analysis with x-compact

Stanojević

Guo

Mitra

et al.

IEEE International Conference on Test, 2005.

View full text Add to dashboard Cite

X-Compactor is an X-tolerant test response compactor that is useful for massive reduction of test data volume and test time. This paper presents a technique for identifying failing flip-flops during scan test directly from the compacted response obtained from X-Compactor outputs. The identified failing flip-flops can be used for several purposes --as inputs to a scan-based diagnosis tool to diagnose defects in combinational logic, to identify defective scan chains, or for statistical data collection during high volume manufacturing to analyze deformations and yield limiters. The presented technique requires no modification to existing scan-based diagnosis tools and has been used in high volume manufacturing flows.

show abstract

Fault diagnosis in designs with convolutional compactors

Cited by 18 publications

References 23 publications

Use of MISR Output Streams for Diagnostics

Use of MISR Output Streams for Diagnostics

On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture

Enabling yield analysis with x-compact

Contact Info

Product

Resources

About