International Meeting for Future of Electron Devices, 2004.
DOI: 10.1109/imfedk.2004.1566393
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Fault location using electron beam current absorbed in LSI interconnects

K. Mizukoshi
1
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Taro Oyamada
2
,
Akira Shimase
3
et al.
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Failure analysis case studies of floating nets in mixed-signal IC

Faure1,
Lombardi2,
Goxe3
2019
Microelectronics Reliability
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Failure analysis case studies of floating nets in mixed-signal IC

Faure1,
Lombardi2,
Goxe3
2019
Microelectronics Reliability
0
0
0
0
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Logic failure analysis 65/45nm device using RCI & nano scale probe

Cho
1
,
Kim
2
,
Hong
3
et al. 2009
2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
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Optimization and application of Electron Beam Absorbed Current technique

Wei
1
,
Soon-Huat
2
,
Zulkifli
3
et al. 2015
2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits
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