Features of the ellipsometric investigation of magnetic nanostructures

Abstract

The technique for interpreting magneto-ellipsometric measurements is proposed. The model of a homogeneous semi-infinite medium for reflecting layered magnetic structures in the presence of the magnetic field in the configuration of the magneto-optical equatorial Kerr effect is considered. Based on the analysis of the Fresnel coefficients with regard to the magneto-optical parameter Q appearing in the offdiagonal elements of the permittivity tensor, the expressions are obtained using which the refraction (n) and absorption (k) coefficients, the real (Q 1 ) and imaginary (Q 2 ) parts of the magneto-optical parameter can be found from the ellipsometric (ψ 0 and Δ 0 ) and magneto-ellipsometric (ψ 0 + δψ and Δ 0 + δΔ) measurements.The results will allow to measure and analyze the magnetic characteristics such as hysteresis loops and the coercitive force of layered nanostructures using the conventional ellipsometric equipment.

Multilayered Ferromagnetic Nanostructures Study: Processing Data from Magneto-Ellipsometry Measurements

“…The general idea of the approach to the inverse problem is already published [11]. Here for the convenience of the reader we provide a brief description of it as the following algorithm is based on the previous research.…”

“…where ψ 0 and Δ 0 are ellipsometry parameters measured without magnetic field application, δψ and δΔ are the values of ellipsometry parameters changes during magnetization reversal. More details about the general approach can be found at [11], about finding optical properties of a layer - [13]. As for the algorithm for data analysis from multilayered structures which is presented in this paper ( Fig.…”

In situ magneto-optical ellipsometry data analysis for films growth control

“…According to the design of the setup [4], we consider T-configuration in which magnetization is z-axis directed, i.e perpendicular to the plane of incidence and parallel to the surface. The key idea of the proposed approach is reported in [7], where it was applied toward the particular case of low magnetic field and consequently the use of small parameters. Here we consider a general case of experimental data processing for the model of a homogeneous semi-infinite medium without any constraints.…”

Two-layer Model of Reflective Ferromagnetic Films in Terms of Magneto-optical Ellipsometry Studies

“…That is why it seems to be reasonable to present reflection coefficients as a sum of magnetic (subscript 1) and non-magnetic (subscript 0) summands [9][10][11]:…”

“…Subscript 01 denotes the electromagnetic wave incidence from ambient medium 0 onto layer 1. Indices 12 are also calculated by formulae for the model of a homogeneous semi-infinite medium, the only difference is that subscript 12 denotes the electromagnetic wave incidence from layer 1 onto layer 2 that leads to the following changes in the formulae for the model of a homogeneous semi-infinite medium: 10 describe the electromagnetic wave propagation from layer 1 to medium 0:…”