2020
DOI: 10.1016/j.apsusc.2020.146225
|View full text |Cite
|
Sign up to set email alerts
|

Femto-second transient absorption spectroscopy for probing near-surface carrier-photon dynamics in gallium nitride

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2021
2021
2022
2022

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 18 publications
0
2
0
Order By: Relevance
“…Information of the surface potential obtained from TAS measurements is in corroboration with the results measured by Kelvin probe force microscopy (KPFM) technique. [ 77 ] The surface potential of the O 2 ‐treated sample obtained from KPFM is comes out to be 0.65 eV with positive polarity. However, it is 0.45 eV with negative polarity for the N 2 ‐treated sample.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Information of the surface potential obtained from TAS measurements is in corroboration with the results measured by Kelvin probe force microscopy (KPFM) technique. [ 77 ] The surface potential of the O 2 ‐treated sample obtained from KPFM is comes out to be 0.65 eV with positive polarity. However, it is 0.45 eV with negative polarity for the N 2 ‐treated sample.…”
Section: Resultsmentioning
confidence: 99%
“…We have used TAS to study the surface properties of two distinct surfaces of planar GaN. [76,77] Two GaN samples are annealed at high temperatures in oxygen and in nitrogen ambient for comparison of their surface properties. Information of the surface potential obtained from TAS measurements is in corroboration with the results measured by Kelvin probe force microscopy (KPFM) technique.…”
Section: Determination Of Surface Properties In Planar Semiconductorsmentioning
confidence: 99%