In this chapter we explore the possibilities offered by focused ion beam milling to fabricate epitaxial islands out of bismuth ferrite thin films. Three processes are described: first one consisting of high-energy direct milling of a film followed by annealing procedures, a second one of high-energy milling of a film coated with a sacrificial layer which is removed successively, and a third one of lowenergy milling of a film previously structured with sacrificial layer islands. Ferroelectric properties of the obtained structures have been investigated at a nanoscale level by piezoresponse force microscopy, in order to evaluate the impact of fabrication-induced damages on the functional properties. Structures produced by direct milling display ferroelectricity only after a post-fabrication annealing procedure, exhibiting polarization pinning only for structures with lateral sizes <500 nm. Detailed investigations have revealed occurrence of pinning and/or high imprint in an area within 100 nm distance from the structure edges, independently of the structure size. On the contrary, 250 nm large islands produced by milling through a sacrificial layer and over the structured sacrificial layer display ferroelectricity, without diminution of functional properties. Hence we conclude that focused ion beam milling is a viable technique for fabrication of ferroelectric structures, in particular bismuth ferrite nanoislands.