Ferroelectric properties of YMnO3 films deposited by metalorganic chemical vapor deposition on Pt/Ti/SiO2/Si substrates

Kim, D.; Killingensmith, D.; Dalton, D.; Olariu, Viorel; Gnadinger, Fred; Rahman, Mosiur; Mahmud, Ali; Kalkur, T. S.

doi:10.1016/j.matlet.2005.08.045

Cited by 12 publications

(5 citation statements)

References 16 publications

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“…Ye et al reported the transformation of hexagonal ErMnO 3 powders, synthesized by solid-state reaction methods, into the orthorhombic phase by high pressure sintering [27]. Others [16,20,21,28] have reported growing hexagonal YMnO 3 films on YSZ, Pt/SrTiO 3 , and Pt/Ti/SiO 2 /Si substrates by PLD or MOCVD respectively. Suzuki et al reported that the hexagonal phase they obtained for YMnO 3 thin films on Pt(111)/TiO x /SiO 2 /Si was due to the heat treatment in vacuum [13].…”

Section: Structural Considerationsmentioning

confidence: 99%

Structure and defect characterization of multiferroic ReMnO₃films and multilayers by TEM

Jehanathan¹,

Lebedev²,

Gélard³

et al. 2010

Nanotechnology

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Epitaxial rare earth manganite thin films (ReMnO(3); Re = Tb, Ho, Er, and Y) and multilayers were grown by liquid injection metal organic chemical vapor deposition (MOCVD) on YSZ(111) and the same systems were grown c-oriented on Pt(111) buffered Si substrates. They have been structurally investigated by electron diffraction (ED) and high resolution transmission electron microscopy (HRTEM). Nanodomains of secondary orientation are observed in the hexagonal YMnO(3) films. They are related to a YSZ(111) and Pt(111) misorientation. The epitaxial film thickness has an influence on the defect formation. TbO(2) and Er(2)O(3) inclusions are observed in the TbMnO(3) and ErMnO(3) films respectively. The structure and orientation of these inclusions are correlated to the resembling symmetry and structure of film and substrate. The type of defect formed in the YMnO(3)/HoMnO(3) and YMnO(3)/ErMnO(3) multilayers is also influenced by the type of substrate they are grown on. In our work, atomic growth models for the interface between the film/substrate are proposed and verified by comparison with observed and computer simulated images.

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Section: Structural Considerationsmentioning

confidence: 99%

Structure and defect characterization of multiferroic ReMnO₃films and multilayers by TEM

Jehanathan¹,

Lebedev²,

Gélard³

et al. 2010

Nanotechnology

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“…The peaks at 30.9 and 28.9 • 2Â-CuK ␣ can be attributed to the phase YMnO 3 ((0 0 4) and (1 1 0) respectively), not reported in the literature concerning the oxidation of yttria films grown onto ferritic stainless steel grades. In fact, the other most intense peaks of this phase ((1 1 2) and (1 1 1) [33]) are found in positions overlapping other phases, whose assignment is unambiguous. Coherently with [8,10], no Y 2 O 3 was found after high-temperature oxidation of the coating.…”

Section: Xrd Of Coatings Electrodeposited Onto Aisi 430mentioning

confidence: 74%

Electrodeposition of yttria/cobalt oxide and yttria/gold coatings onto ferritic stainless steel for SOFC interconnects

Tondo

Boniardi

Cannoletta

et al. 2010

Journal of Power Sources

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“…There are few reports on the growth of YMnO 3 on such a stack (or similar stack such as (111)Pt/ZrO 2 /SiO 2 /Si) [12][13][14]. Other reports on (111)Pt deal with stacks starting from (0001)Al 2 O 3 or (111)MgO [15,16].…”

Section: Resultsmentioning

confidence: 99%

Thin films and superlattices of multiferroic hexagonal rare earth manganites

Dubourdieu

Huot

Gélard

et al. 2007

Philosophical Magazine Letters

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Hexagonal YMnO 3 and HoMnO 3 as well as (YMnO 3 /HoMnO 3 ) 15 superlattices were grown on (111) ZrO 2 (Y 2 O 3 ) and (111) Pt/TiO 2 /SiO 2 /p-type (100)Si substrates. Epitaxial stabilization was used on the same substrates to grow DyMnO 3 or TbMnO 3 (which normally crystallize in an orthorhombic, perovskite-type, structure). All heterostructures were obtained oriented, with the c-axis of the hexagonal cell perpendicular to the substrate plane. This orientation is desired since it is the direction of the ferroelectric polarization in hexagonal manganites. The strain state of the films grown on conductive Pt electrodes, tracked by the evolution of the c parameter as a function of film thickness, was found to be completely different than the one obtained on YSZ. Such a study is important for future strain engineering in multilayers. Highresolution transmission electron microscopy on superlattices grown on (111)Pt indicates a high crystalline quality along the c-axis and sharp interfaces.

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Ferroelectric properties of YMnO3 films deposited by metalorganic chemical vapor deposition on Pt/Ti/SiO2/Si substrates

Cited by 12 publications

References 16 publications

Structure and defect characterization of multiferroic ReMnO₃films and multilayers by TEM

Structure and defect characterization of multiferroic ReMnO₃films and multilayers by TEM

Electrodeposition of yttria/cobalt oxide and yttria/gold coatings onto ferritic stainless steel for SOFC interconnects

Thin films and superlattices of multiferroic hexagonal rare earth manganites

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Ferroelectric properties of YMnO3 films deposited by metalorganic chemical vapor deposition on Pt/Ti/SiO2/Si substrates

Cited by 12 publications

References 16 publications

Structure and defect characterization of multiferroic ReMnO3films and multilayers by TEM

Structure and defect characterization of multiferroic ReMnO3films and multilayers by TEM

Electrodeposition of yttria/cobalt oxide and yttria/gold coatings onto ferritic stainless steel for SOFC interconnects

Thin films and superlattices of multiferroic hexagonal rare earth manganites

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Product

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Structure and defect characterization of multiferroic ReMnO₃films and multilayers by TEM

Structure and defect characterization of multiferroic ReMnO₃films and multilayers by TEM