Ferromagnetic resonance linewidth of Fe ultrathin films grown on a bcc Cu substrate

Celiński, Z.; Heinrich, B.

doi:10.1063/1.350110

Cited by 135 publications

(64 citation statements)

References 11 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The amplitude of the fourfold anisotropy in ⌬H was approximately 1 / 5 of the isotropic contribution. Our previous studies using the lattice strained Fe͑001͒ films on Cu͑001͒ and Pd͑001͒ substrates indicate 19,20 that a part of the lattice defects in the NiMnSb͑001͒ films follow the ͗100͘ directions, consistent with the TEM results.…”

Section: B Magnetic Propertiessupporting

confidence: 76%

Structural and magnetic properties of NiMnSb/InGaAs/InP(001)

Koveshnikov

Woltersdorf

Liu

et al. 2005

Journal of Applied Physics

Self Cite

View full text Add to dashboard Cite

The structural and magnetic properties of NiMnSb films, 5-120 nm thick, grown on InGaAs/ InP͑001͒ substrates by molecular-beam epitaxy, were studied by x-ray diffraction, transmission electron microscopy ͑TEM͒, and ferromagnetic resonance ͑FMR͒ techniques. X-ray diffraction and TEM studies show that the NiMnSb films had the expected half-Heusler structure, and films up to 120 nm were pseudomorphically strained at the interface, greater than the critical thickness for this system, about 70 nm ͑0.6% mismatch to InP͒. No interfacial misfit dislocations were detected up to 85 nm, however, relaxation in the surface regions of films thicker than 40 nm was evident in x-ray reciprocal space maps. TEM investigations show that bulk, planar defects are present beginning in the thinnest film ͑10 nm͒. Their density remains constant but they gradually increase in size with increasing film thickness. By 40 nm these defects have overlapped to form a quasicontinuous network aligned closely with ͗100͘ in-plane directions. The associated strain fields and or compositional ordering from these defects introduced a reduction in crystal symmetry that influenced the magnetic properties. The in-plane and perpendicular FMR anisotropies are not well described by bulk and interface contributions. In thick films, the in-plane uniaxial and fourfold anisotropies increased with increasing film thickness. The lattice defects resulted in a large extrinsic magnetic damping caused by two-magnon scattering, an increase in the coersive field with increasing film thickness, and a lower magnetic moment ͑3.6 Bohr magnetons͒ compared to the expected value for the bulk crystals ͑4 Bohr magnetons͒.

show abstract

Section: B Magnetic Propertiessupporting

confidence: 76%

Structural and magnetic properties of NiMnSb/InGaAs/InP(001)

Koveshnikov

Woltersdorf

Liu

et al. 2005

Journal of Applied Physics

Self Cite

View full text Add to dashboard Cite

show abstract

“…This means lattice imperfections do not contribute to the FMR linewidth and therefore the measured G is the intrinsic Gilbert damping. This is a unique result not commonly reported for ultrathin films [14].…”

mentioning

confidence: 46%

Gilbert Damping in Single and Multilayer Ultrathin Films: Role of Interfaces in Nonlocal Spin Dynamics

2001

Self Cite

View full text Add to dashboard Cite

Unique features of the Gilbert damping in magnetic multilayers were investigated by ferromagnetic resonance (FMR) using magnetic single and double layer structures prepared by molecular beam epitaxy. The FMR linewidth for the Fe films in the double layer structures was larger than the FMR linewidth in the single Fe films having the same thickness. The additional FMR linewidth scaled inversely with the film thickness, and increased linearly with increasing microwave frequency. These results demonstrate that a transfer of electron angular momentum between the magnetic layers leads to additional relaxation torques.

show abstract

“…The contribution from magnetic inhomogeneities to the effective damping parameter can be deduced from a decay of a Ã as a function of bias field [25]. This effect is only observable in a large range of magnetic bias fields, as can be seen in Fig.…”

Section: Magnetic Relaxationmentioning

confidence: 97%

Comparison of frequency, field, and time domain ferromagnetic resonance methods

Neudecker¹,

Woltersdorf²,

Heinrich³

et al. 2006

Journal of Magnetism and Magnetic Materials

Self Cite

132

View full text Add to dashboard Cite

We present vector network analyzer ferromagnetic resonance measurements of epitaxial Fe films having a thickness of 16 monolayers. Our objective is to test the reliability of this novel frequency domain technique with respect to frequency and damping. For this purpose we compare vector network analyzer ferromagnetic resonance to pulsed inductive microwave magnetometry, time resolved magnetooptic Kerr effect (both methods in the time domain), and conventional ferromagnetic resonance (measured in the field domain) in terms of position and width of the ferromagnetic resonance. In addition, we compare the various techniques with respect to the signal to noise ratio of the raw data. All data is obtained using the same well characterized ultrathin magnetic Fe/GaAs (0 0 1) film. Finally, we demonstrate the potential of the vector network analyzer ferromagnetic resonance technique for the investigation of nano-structured magnetic elements having nonuniform magnetization configuration. The absorption spectrum of Permalloy disks with a diameter of 200 nm and a thickness of 15 nm shows up to eight distinct resonance peaks. The spatial structure of the corresponding modes was derived from numerical calculations and reveals that azimuthal modes up to the fifth order have been observed inductively. r

show abstract

Ferromagnetic resonance linewidth of Fe ultrathin films grown on a bcc Cu substrate

Cited by 135 publications

References 11 publications

Structural and magnetic properties of NiMnSb/InGaAs/InP(001)

Structural and magnetic properties of NiMnSb/InGaAs/InP(001)

Gilbert Damping in Single and Multilayer Ultrathin Films: Role of Interfaces in Nonlocal Spin Dynamics

Comparison of frequency, field, and time domain ferromagnetic resonance methods

Contact Info

Product

Resources

About