Swift heavy ions (SHI) available with 15 million Volt Pelletron accelerator at Inter University Accelerator Centre (IUAC) Delhi, formerly known as Nuclear Science Centre, (NSC), provide a unique opportunity to researchers for accelerator based materials science research. The major research areas can be broadly categorised as electronic sputtering, interface modifications, synthesis and modification of nanostructures, phase transitions and ion beam-induced epitaxial crystallisation. In, general, SHI irradiation based-materials may not be economically feasible, still it could be of interest for very specific cases in defence and space research. The paper gives a glimpse of the current research activities in materials science with SHIs, at IUAC.Keywords: Swift heavy ions, SHI, materials science, materials research systhesis of materials, characterisation of materials, nuclear energy loss, ion energy loss, electronic energy-loss-defects in materials, defect engineering
INTRODUCTIONThe ions with energy ranging from a fraction of keV to GeV are useful in synthesis, modification and characterization of materials. The energetic ions during their passage through a material loose energy via two processes. These are nuclear energy loss S n and electronic energy loss S e . In the former process, the energy is lost by elastic collisions of incident ions with the atoms in the material, which is dominant at low energies. In the electronic energy loss process, dominant at high energies (>1 MeV/nucleon), the energy is lost by inelastic collisions of the ion with the atoms, leading to excitation or ionisation of the atoms. At these energies of heavy ions, the velocity of the ion is comparable to or higher than the velocity of Bohr electron. The ions with such high energies are also referred to as Swift Heavy Ions (SHI). The electronic energy loss for SHI is, generally, about two orders of magnitude higher than the nuclear energy loss1 . An interesting characteristic of the SHI is that it creates a columnar type of defect along its path (called as ion track), specially, in insulators. SHI during its passage through material can cause defect annealing, cluster of point defects and columnar type of defects depending on the mass and energy of the ion and the material. Therefore the SHI can be used for engineering the defects in the materials. The parameters of ion beam, which play crucial role in defect engineering, are the energy deposited per unit length and the fluence.The ion mass and its energy, decide the magnitudes of the electronic as well as nuclear energy losses. Especially for heavy ions at high energies (i.e., for SHI), the electronic energy loss decides the type of defects as the nuclear energy loss. The other ion beam parameter, fluence, dictates the number of defects (produced). The number of ion