Fiber optic birefringence enhanced accelerometer based on polarized modal interferometer

Zhang, Gang; Wu, Xuqiang; Li, Shili; Guang, Dong; Liu, Wei; Zuo, Cheng; Fang, Shasha; Yu, Benli

doi:10.1016/j.optcom.2019.02.062

Cited by 14 publications

(3 citation statements)

References 14 publications

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“…However, the power of ABS noise increases with the decreases of the gain of the probe signal, as obtained in the simulations. Due to the influence of fiber birefringence, [22,23] even when the relative SOP of the input pump and probe signal is adjusted to orthogonal state, the probe signal will still be magnified slightly in the experiment. Figure 6 shows the effect of input probe signal power on the ABS noise in two particular relative SOPs of pump and probe signal.…”

Section: Experiments Setup and Resultsmentioning

confidence: 99%

Polarization dependence of gain and amplified spontaneous Brillouin scattering noise analysis for fiber Brillouin amplifier*

Shang

Tang

et al. 2019

Chinese Phys. B

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The polarization dependences of gain and amplified spontaneous Brillouin scattering (ABS) noise for fiber Brillouin amplifier (FBA) are analyzed through theories, simulations, and experiments. Modified vector propagation equations for calculating the gain of the probe signal and the ABS noise are derived and analyzed in the Stokes spaces. In simulations and experiments, we prove that the gain of the probe signal and the ABS noise are strongly dependent on the relative state of polarization (SOP) of the pump and probe signals. The closer the relative SOP of the pump and probe signals is, the more obvious ABS noise suppression effect will be brought by increasing the power of the input probe signal.

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Section: Experiments Setup and Resultsmentioning

confidence: 99%

Polarization dependence of gain and amplified spontaneous Brillouin scattering noise analysis for fiber Brillouin amplifier*

Shang

Tang

et al. 2019

Chinese Phys. B

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“…These characteristics make them the preferred choice for displacement measurement in numerous electromechanical applications. 7,8 In the realm of semiconductor manufacturing equipment, lithography machines play a crucial role in the fabrication of semiconductor chips. The ultra-precision high-speed and ultra-precise step-scan movements, serving as a key subsystem within lithography machines.…”

Section: Introductionmentioning

confidence: 99%

Optical Grating Diffraction and Optical Beat Frequency Principle-Based Ultrahigh Resolution Displacement Measurement System

O.Pandithurai

2023

IJRITCC

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This research presents a novel displacement measurement system that combines optical grating diffraction, the optical Doppler principle, and the optical beat frequency principle. The system utilizes a double-frequency laser device, an interferometer, a measuring grating, and an electrical signal processing unit. By dividing the laser into reference light and measuring light and analyzing the beat frequency signal generated by the interaction of the measuring light and the reference light, the system achieves precise linear displacement measurements in two directions. The system offers sub-nanometer-grade or even higher resolution and accuracy, simultaneous measurement of horizontal large-stroke displacement and horizontal displacement, and exhibits advantages such as environmental insensitivity, high measurement accuracy, compact size, and lightweight. The proposed system finds potential applications in ultraprecise workpiece platform position measurement systems, contributing to the overall performance improvement of lithography machines.

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“…The power beam splitter, which can distribute the energy of incident light evenly to multiple output directions, is called a multi-port beam splitter [1][2][3][4][5]. These beam splitters are very common optical elements that can be used in couplers [6][7][8][9], quantum teleportation [10], polarizers [11][12][13][14] and polarization detection systems [15,16]. For gratings, the energies of splitting orders can be modulated for various applications [17][18][19][20].…”

Section: Introductionmentioning

confidence: 99%

Polarization-independent reflection grating in second-order Littrow for high laser resolving power

Fang¹,

Wang²

2020

Laser Phys.

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In order to obtain a grating solution for high laser resolving power, a multilayer fused-silica reflection grating is described with a silver layer embedded in the groove in second-order Littrow configuration instead of first-order mounting. Efficiencies of 96.17% and 96.14% can diffracted in −2nd order for TE and TM polarizations, which are greater than 96%. The new multilayer reflection grating with a silver layer embedded has good incident characteristics and process tolerances. Therefore, the high-efficiency output with polarization-independent and wideband property characteristics of the grating will be well applied to the laser field.

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Fiber optic birefringence enhanced accelerometer based on polarized modal interferometer

Cited by 14 publications

References 14 publications

Polarization dependence of gain and amplified spontaneous Brillouin scattering noise analysis for fiber Brillouin amplifier*

Polarization dependence of gain and amplified spontaneous Brillouin scattering noise analysis for fiber Brillouin amplifier*

Optical Grating Diffraction and Optical Beat Frequency Principle-Based Ultrahigh Resolution Displacement Measurement System

Polarization-independent reflection grating in second-order Littrow for high laser resolving power

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