2014
DOI: 10.1016/j.spmi.2014.05.034
|View full text |Cite
|
Sign up to set email alerts
|

Field dependence of magnetization for a thin ferromagnetic film on rough antiferromagnetic surface

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
7
0
1

Year Published

2014
2014
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(8 citation statements)
references
References 12 publications
0
7
0
1
Order By: Relevance
“…The field dependence of magnetization at low values of the latter is easy to find using Eqs. (17) and (19). In the absence of a field, the values of the elliptic moduli k A ¼ k B ¼ k 0 are determined by the equation…”
Section: Model Formulationmentioning
confidence: 96%
See 1 more Smart Citation
“…The field dependence of magnetization at low values of the latter is easy to find using Eqs. (17) and (19). In the absence of a field, the values of the elliptic moduli k A ¼ k B ¼ k 0 are determined by the equation…”
Section: Model Formulationmentioning
confidence: 96%
“…In some cases magnetic contact through the interface exists only for a small number of surface FM and AFM atoms (magnetic point contacts). 17 In other cases, lines of atomic steps (AS) can form at the AFM surface, dividing the AFM surface regions with oppositely directed magnetic moments. 13,14 If the surface is, on average, homogeneous, then the interface has alternating steps with opposite signs.…”
Section: Introductionmentioning
confidence: 99%
“…3(б). Такая одномерная задача исследовалась ранее в применении к слоистым ФМ/АФМ системам для нескомпенсированных ГР в [10,11] и скомпенсированных и неупорядоченных границ в [14,15].…”
Section: перемагничивание радиально симметричного кластера большого рunclassified
“…15 In our previous study, we proposed a model of point magnetic contacts at the FM/AFM interface, in order to explain the EB effect in a two-layer system with a rough interface. 16 In this study we are examining a trilayer structure with one ideal and one rough FM/AFM interface (Fig. 4).…”
Section: The Influence Of Defects On the Properties Of Magnetization mentioning
confidence: 99%