2020
DOI: 10.1038/s41535-020-0242-4
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Field-induced resistance peak in a superconducting niobium thin film proximity coupled to a surface reconstructed SrTiO3

Abstract: Oxygen vacancy is known to play an important role for the physical properties in SrTiO3(STO)-based systems. On the surface, rich structural reconstructions had been reported owing to the oxygen vacancies, giving rise to metallic surface states and unusual surface phonon modes. More recently, an intriguing phenomenon of a huge superconducting transition temperature enhancement was discovered in a monolayer FeSe on STO substrate, where the surface reconstructed STO (SR-STO) may play a role. In this work, SR-STO … Show more

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Cited by 13 publications
(6 citation statements)
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“…We grew all the films under a similar ozone environment and within the adsorption-controlled growth regime. Hence, the significant change in RRR and (5 K) with respect to the is not likely due to either the oxygen vacancy in STO 40 or SRO stoichiometry. To further clarify the oxygen vacancy issue, we post-annealed a sample at 400 C for 8 h under 1 atm O flow, where no noticeable change in the RRR and (5 K) was observed due to post-annealing.…”
Section: Discussionmentioning
confidence: 94%
“…We grew all the films under a similar ozone environment and within the adsorption-controlled growth regime. Hence, the significant change in RRR and (5 K) with respect to the is not likely due to either the oxygen vacancy in STO 40 or SRO stoichiometry. To further clarify the oxygen vacancy issue, we post-annealed a sample at 400 C for 8 h under 1 atm O flow, where no noticeable change in the RRR and (5 K) was observed due to post-annealing.…”
Section: Discussionmentioning
confidence: 94%
“…[ 47,48 ] The details of discussion on this possible scenario would not be presented here, which is beyond the scope of this work. For the present STO–electrolyte configuration, the Ti 3 d conduction band, surface reconstruction, [ 49 ] and defects‐induced consequences may be all non‐negligible or so. [ 46 ] These sensitivities and consequences can be essentially illustrated in the complex phase diagram, and one updated one is drawn in Figure in more or less semiquantitative sense.…”
Section: Resultsmentioning
confidence: 99%
“…[21,22] However, I-RRAM is usually based on interfacial barrier modulation caused by the migration of ions and ion defects such as oxygen ions and vacancies. [23][24][25][26][27][28] It has no electroforming process and will not produce the problems of high variation and low yield caused by electroforming. [29] Through this mechanism, I-RRAM can exhibit stable analog resistance switching (RS) behavior during SET and RESET transitions, enabling more continuous and controllable conductance changes.…”
Section: Introductionmentioning
confidence: 99%