Field Ionization of Gases at a Metal Surface and the Resolution of the Field Ion Microscope

Müller, Erwin W.; Bahadur, Kanwar

doi:10.1103/physrev.102.624

Cited by 254 publications

(95 citation statements)

References 13 publications

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“…The obvious exciting question was whether the technique could be improved to resolve atoms. There were false starts and some luck, but eventually, on October 10, 1955, Müller and his graduate student, Kanwar Bahadur, recorded the first ever images of atoms [7][8] (Figure 2c). Melmed has provided a summary of the events leading up to this momentous occasion [9].…”

Section: The Atom Probe Is Bornmentioning

confidence: 99%

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The First Fifty Years of Atom Probe

Kelly

Panitz

2017

Micros. Today

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With a brief look to historical precedence, the birth of atom probe and its key evolutionary steps are recounted: from the earliest field emission experiments to the latest three-dimensional competitive analysis of advanced light emitting diodes. We note that electron microscopy and atom probe have been almost sibling twentiethcentury technologies that provide atomic-level imaging. Given the rate of development, the next fifty years should be even more amazing.

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Section: The Atom Probe Is Bornmentioning

confidence: 99%

“…ledges of a tip surface [6]. (c) First ever images to show individual atoms were recorded on October 11, 1955, by Bahadur and Müller [7,8] as recounted by Melmed [9]. to figure out how to detect single atoms!…”

Section: The Atom Probe Is Bornmentioning

confidence: 99%

The First Fifty Years of Atom Probe

Kelly

Panitz

2017

Micros. Today

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“…APT works on the phenomena of field evaporation, by which surface atoms of the specimen are ionized in ultrahigh vacuum and subsequently desorbed by an electric field Muller & Bahadur, 1956!. A schematic of the APT instrumentation is shown in Figure 1. The field evaporation process is effectively controlled by utilizing a cryogenically cooled~to reduce atomistic vibrations!…”

Section: Atom Probe Tomographymentioning

confidence: 99%

Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip

Tourek

Sundararajan

2010

Microsc Microanal

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Three-dimensional atom probe tomography (APT) is successfully used to analyze the near-apex regions of an atomic force microscope (AFM) tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented. Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales. Abstract: Three-dimensional atom probe tomography~APT! is successfully used to analyze the near-apex regions of an atomic force microscope~AFM! tip. Atom scale material structure and chemistry from APT analysis for standard silicon AFM tips and silicon AFM tips coated with a thin film of Cu is presented.Comparison of the thin film data with that observed using transmission electron microscopy indicates that APT can be reliably used to investigate the material structure and chemistry of the apex of an AFM tip at near atomic scales.

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“…Previously reported measurements of the capture region for an ambient gas near equilibrium and its dependence on tip parameters have led to divergent results. [11][12][13][14][15][16] Moreover, just two measurements, 9,17 for a directed, supersonic gas source have been reported and the dependence on tip parameters was not systematically investigated. This capture region in a supersonic beam is smaller than desired in some applications, and in any case one would like to understand and to control the size of capture region.…”

Section: Introductionmentioning

confidence: 99%

Current-voltage relation for a field ionizing He beam detector

DePonte

Elliott

Kevan

2009

Journal of Applied Physics

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Emerging interest in utilizing the transverse coherence properties of thermal energy atomic and molecular beams motivates the development of ionization detectors with near unit detection efficiency and adequate spatial resolution to resolve interference fringes of submicron dimension. We demonstrate that a field ionization tip coupled to a charged particle detector meets these requirements. We have systematically studied the current-voltage relationship for field ionization of helium using tungsten tips in diffuse gas and in a supersonic helium beam. For all 16 tips used in this study, the dependence of ion current on voltage for tips of fixed radius was found to differ from that for tips held at constant surface electric field. A scaling analysis is presented to explain this difference. Ion current increased on average to the 2.8 power of voltage for a tip at fixed field and approximately fifth power of voltage for fixed radius for a liquid nitrogen cooled tip in room temperature helium gas. For the helium beam, ion current increased as 2.2 power of voltage with constant surface field. The capture region of the tips was found to be up to 0.1 m 2 for diffuse gas and 0.02 m 2 in the beam. Velocity dependence and orientation of tip to beam were also studied.

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Field Ionization of Gases at a Metal Surface and the Resolution of the Field Ion Microscope

Cited by 254 publications

References 13 publications

The First Fifty Years of Atom Probe

The First Fifty Years of Atom Probe

Atom Scale Characterization of the Near Apex Region of an Atomic Force Microscope Tip

Current-voltage relation for a field ionizing He beam detector

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