2021
DOI: 10.1002/admi.202101476
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Film‐Depth‐Dependent Light Reflection Spectroscopy for Photovoltaics and Transistors

Abstract: Organic thin films are widely investigated for solar cells, field‐effect transistors, and other thin film devices. However, rare methods are available to characterize the film‐depth dependent variations of materials. Here, a film‐depth‐dependent light reflection spectroscopy of polymer thin films is proposed to sequentially show the optical properties at each film‐depth and consequently characterize the vertical phase segregation of polymer thin films, which is applicable for both transparent and opaque system… Show more

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Cited by 9 publications
(6 citation statements)
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“…As shown in Figure 7b,f, the composition distribution profiles of a-BTR-H4 and Y6 at different film-depths could be fitted by the FLAS plots with the absorption spectra. [59][60][61] Obviously, a-BTR-H4:Y6 with 120 °C TA shows a more uniform phase distribution throughout the whole active layer vertically, especially on the surface of the blend, which is consistent with the above CA and AFM results. The blend film without TA possesses serious vertical phase separation, wherein donor and acceptor both show a gradient distribution with higher concentrations of Y6 near the cathode, and a-BTR-H4 near the anode, respectively.…”
Section: Crystallization Process and Internal State Of Blend Filmssupporting
confidence: 88%
“…As shown in Figure 7b,f, the composition distribution profiles of a-BTR-H4 and Y6 at different film-depths could be fitted by the FLAS plots with the absorption spectra. [59][60][61] Obviously, a-BTR-H4:Y6 with 120 °C TA shows a more uniform phase distribution throughout the whole active layer vertically, especially on the surface of the blend, which is consistent with the above CA and AFM results. The blend film without TA possesses serious vertical phase separation, wherein donor and acceptor both show a gradient distribution with higher concentrations of Y6 near the cathode, and a-BTR-H4 near the anode, respectively.…”
Section: Crystallization Process and Internal State Of Blend Filmssupporting
confidence: 88%
“…The correlation between experimental and predicted values illustrates the usefulness of the polariton concept for understanding the optical properties of molecular crystals. , Yet surprisingly little experimental evidence has appeared indicating a role for polaritons in organic optoelectronic devices . This may be related to the fact that often the molecular layers used are amorphous. Here we investigate a polycrystalline film of the non-fullerene acceptor ( S,S )-BTP-4F ( 1 ). , We show that, while for amorphous films hardly any polariton characteristics are observable, for thermally annealed polycrystalline films the reflection spectrum shows a pronounced minimum in the middle of the lowest band.…”
mentioning
confidence: 79%
“…Apart from studying the molecular interaction, orientation and phase separation, the vertical electronic properties of the blend films are also investigated by performing film‐depth‐dependent light absorption spectroscopy (FLAS). [ 62 ] As shown in Figure a–d, from intact films (top curves) to the mostly etched films (lowest absorption curves), T4‐ and T6‐based blends display obviously distinct absorption spectra after SVA with CS 2 compared with their corresponding as‐cast ones in terms of both optical density and relative peak intensity, which could originate from the different vertical component distribution and changes in absorbing ability of donor and acceptor. By fitting the sublayer absorption from the FLAS results of the blend films using the absorption spectra of pure materials, we obtain the composition distribution along the direction of film depth (Figure 5e,f).…”
Section: Resultsmentioning
confidence: 99%