2001
DOI: 10.1016/s0921-4534(00)01555-0
|View full text |Cite
|
Sign up to set email alerts
|

Film thickness dependence of microwave surface resistance and microstructure in YBa2Cu3O7−δ thin films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2002
2002
2015
2015

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 23 publications
0
1
0
Order By: Relevance
“…Unfortunately, a so-called ''thickness effect'' phenomenon that J c drops rapidly with the increase in film thickness could not be avoided no matter which kind of technique is adopted [1,[11][12][13][14][15]. For the preparation of micrometer-thick film, it is an important problem which hinders the I c improvement in YBCO coated conductors.…”
Section: Introductionmentioning
confidence: 99%
“…Unfortunately, a so-called ''thickness effect'' phenomenon that J c drops rapidly with the increase in film thickness could not be avoided no matter which kind of technique is adopted [1,[11][12][13][14][15]. For the preparation of micrometer-thick film, it is an important problem which hinders the I c improvement in YBCO coated conductors.…”
Section: Introductionmentioning
confidence: 99%