Fine Structure of Thermal Runaway Process in the V3Si Single–crystal Superconductor as a Result of Pinning Center Response

Chabanenko, V. V.; Kodess, B.N.; Vasiliev, S.; Kuzovoi, N. V.; Kuchuk, E.; Kononogov, S. A.; Szymczak, H.

doi:10.1016/j.phpro.2012.06.181

Cited by 5 publications

(4 citation statements)

References 7 publications

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“…Although flux avalanches have been reported in single crystals of V 3 Si [4], [5], [6], to the best of our knowledge, there was no direct observation of avalanches in thin films of this superconductor, whose class A15 includes materials of wide use in applications, such as Nb 3 Ge and Nb 3 Sn [7]. As a matter of fact, dendritic avalanches have already been observed in thin films of Nb 3 Sn, as reported by Rudnev and coworkers [8].…”

Section: Introductionmentioning

confidence: 99%

Imaging Flux Avalanches in V$_3$Si Superconducting Thin Films

Pinheiro

Motta

Colauto

et al. 2019

IEEE Trans. Appl. Supercond.

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When developing superconducting devices patterned on thin films one should bear in mind that flux avalanches might occur for some materials at a certain window of applied fields and temperatures. Although the A15 superconductors are well known and used in a variety of purposes, there are no studies about flux avalanches in V3Si thin films. In the present work we report the observation of flux avalanches in films of V3Si, grown by Pulsed Laser Deposition on a LaAlO3 substrate. The range of temperatures and applied magnetic fields at which the avalanches take place was determined using dc-magnetometry. Magneto-Optical Imaging was employed to visualize the occurrence and spatial distribution of such flux avalanches. Images of the flux penetrated into the samples indicate a clear anisotropic distribution, which is ascribed to a thickness gradient. The observation of flux avalanches reported here imply that attention to this feature must be given when films of V3Si are envisaged for possible applications.

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Section: Introductionmentioning

confidence: 99%

Imaging Flux Avalanches in V$_3$Si Superconducting Thin Films

Pinheiro

Motta

Colauto

et al. 2019

IEEE Trans. Appl. Supercond.

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“…In previous work [2], using the data acquisition board (DAQ) with the time resolution to within ≈ 10 −7 s, we reveal fine structure of giant flux jumps going out from V 3 Si single crystal (flux trapping mode) as a result of thermomagnetic avalanche during slow ramp of external magnetic field. It was shown that avalanches consist of a large number of very short (≈ 10 µs) microavalanches and that each of the microavalanches has its own structure.…”

Section: Introductionmentioning

confidence: 81%

“…The magnetic field was directed perpendicular to the surface of the disk and parallel to the crystallographic orientation of the crystal (111). A more detailed description of the experiment is presented in [2], the details of crystals preparation and the magnetic properties of this sample -see in [13].…”

Section: (41)mentioning

confidence: 99%

Microavalanches Size Distribution in Fine Structure of Thermomagnetic Flux Jumps in the V₃Si Monocrystal Superconductor

et al. 2019

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The fine structure of huge thermomagnetic flux jumps in V3Si single crystal was analyzed in detail. Structure of avalanches consists of several hundreds of microavalanches. The magnitude of the flux of the microavalanches and their duration were determined. The histograms of the distribution of microflux jumps magnitudes are plotted (the number of microavalanches as a function of the outgoing flux size) for different temperatures. The role of microstructure pinning centers was discussed on the assumption that microavalanches are jumps of flux bundles. In such case, fine structure of the avalanche can characterize the parameters of the pinning centers (size, number of pinned vortices, etc.).

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“…The nonlinearity of the response of a multicomponent system to external influences at the electronic and atomic level of structure was inherited during the transition to a larger scale of the structure [11][12] and vice versa. For several samples this manifested itself in the appearance of chaotic phenomena and avalanches when exposed to a strong magnetic field [13][14] of near the superconducting state.…”

Section: Discussionmentioning

confidence: 99%

Oscillatory Changes in Structural Characteristics in Multicomponent Ceramics, YBCO

Kodess

2022

Materials Research Proceedings

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Abstract. The structural characteristics of samples of a four-component superconducting material (YBCO) after exposure to X-ray irradiation during a long time are investigated. The effect of X-ray beam processing on angular positions (corresponding parameters of the crystal lattice) and the width of Bragg reflections is established. The phenomenon of oscillatory behavior in the unit cell dimension with long-time irradiation is found. The analysis of the profiles of reflection also demonstrates the presence of reversible changes phase composition with the exposure time. The observed phenomena reflect the presence of a nontrivial and specific process of compression and expansion of the unit cell due to the accumulation and then disengagement outside of ionized oxygen, which is formed under such irradiation exposure on the surface of the samples.

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Fine Structure of Thermal Runaway Process in the V3Si Single–crystal Superconductor as a Result of Pinning Center Response

Cited by 5 publications

References 7 publications

Imaging Flux Avalanches in V$_3$Si Superconducting Thin Films

Imaging Flux Avalanches in V$_3$Si Superconducting Thin Films

Microavalanches Size Distribution in Fine Structure of Thermomagnetic Flux Jumps in the V₃Si Monocrystal Superconductor

Oscillatory Changes in Structural Characteristics in Multicomponent Ceramics, YBCO

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Fine Structure of Thermal Runaway Process in the V3Si Single–crystal Superconductor as a Result of Pinning Center Response

Cited by 5 publications

References 7 publications

Imaging Flux Avalanches in V$_3$Si Superconducting Thin Films

Imaging Flux Avalanches in V$_3$Si Superconducting Thin Films

Microavalanches Size Distribution in Fine Structure of Thermomagnetic Flux Jumps in the V3Si Monocrystal Superconductor

Oscillatory Changes in Structural Characteristics in Multicomponent Ceramics, YBCO

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Microavalanches Size Distribution in Fine Structure of Thermomagnetic Flux Jumps in the V₃Si Monocrystal Superconductor