2015 11th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) 2015
DOI: 10.1109/prime.2015.7251353
|View full text |Cite
|
Sign up to set email alerts
|

Finite element analysis of uniaxial bending of ultra-thin silicon dies embedded in flexible foil substrates

Abstract: We report a Finite Element Model to calculate the bending stress of thin and ultra-thin silicon dies embedded in flexible foil substrates (chip-in-foil package) at lower bending radii. The values of fracture strength computed using Finite Element Analysis showed very good agreement with the experimental results. Furthermore, an increase in the fracture or critical stress (bending stress at fracture) of the dies due to embedding in flexible foil substrates was observed. Besides, the impact of foil material and … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

0
7
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
4
3

Relationship

2
5

Authors

Journals

citations
Cited by 7 publications
(7 citation statements)
references
References 9 publications
0
7
0
Order By: Relevance
“…This point has to be considered when designing flexible electronics. Palavesam et al [ 25 , 29 ] compared the breaking strength of bare thin chips and chips embedded in flexible foil. They found that chips embedded in flexible film substrates have a higher breaking strength, up to 80% more than bare chips.…”
Section: Mechanics Of Bendingmentioning
confidence: 99%
See 3 more Smart Citations
“…This point has to be considered when designing flexible electronics. Palavesam et al [ 25 , 29 ] compared the breaking strength of bare thin chips and chips embedded in flexible foil. They found that chips embedded in flexible film substrates have a higher breaking strength, up to 80% more than bare chips.…”
Section: Mechanics Of Bendingmentioning
confidence: 99%
“…Since the ultra-thin chips are mechanically very flexible and can achieve a deflection higher than their thickness, resulting in very small bending radii, their bending stress cannot be evaluated with classical beam theory. However, the investigation of this bending stress and achievable bending radii is of great relevance, since this information is the key to the design and manufacture of more robust and reliable flexible electronic systems [ 25 , 29 ].…”
Section: Mechanics Of Bendingmentioning
confidence: 99%
See 2 more Smart Citations
“…A majority of the aforementioned applications require devices that are anticipated to bend repeatedly during the device usage, for, e.g., sensors and actuators placed in smart plasters and electronic skin. However, FHE is a relatively younger field of research that is still in its nascent stages of development and hence, information available regarding the static [27][28][29][30][31][32] as well as dynamic bending reliability [33][34][35][36] of FHE components is rather very limited. Several studies have shown that the failure of chip-foil packages during repeated bending occur mainly because of the cracking of interconnects rather than the delamination of the chip from foil or chip fracture [34][35][36].…”
Section: Introductionmentioning
confidence: 99%