Abstract:The resistivity scaling of metals is a crucial factor for further downscaling of interconnects in nanoelectronic devices that affects signal delay, heat production, and energy consumption. Here, we present a screening method for metals with highly anisotropic band structures near the Fermi level with the aim to select promising materials in terms of their electronic transport properties and their resistivity scaling at the nanoscale. For this, we consider a temperature-dependent transport tensor, based on band… Show more
“…8a) led to a mean free path of λ = 11.2 nm, in agreement with the results in [13]. We remark that the resistivity of bulk cubic Mo is anisotropic as is the mean free path in this framework [53]. The model further requires the knowledge of the film thickness dependence of the linear intercept length between grain boundaries (related to the grain size [54]).…”
Section: Resistivity Scaling Of Mo Thin Films On Siosupporting
“…8a) led to a mean free path of λ = 11.2 nm, in agreement with the results in [13]. We remark that the resistivity of bulk cubic Mo is anisotropic as is the mean free path in this framework [53]. The model further requires the knowledge of the film thickness dependence of the linear intercept length between grain boundaries (related to the grain size [54]).…”
Section: Resistivity Scaling Of Mo Thin Films On Siosupporting
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