A systematic investigation of the boron-doped silicon
clusters
Si
n
B with n ranging from
1 to 10 in the neutral, anionic, and cationic states is performed
using quantum chemical calculations. Lowest-energy minima of the clusters
considered are identified on the basis of the B3LYP, G4, and CCSD(T)
energies. Total atomization energies and thermochemical properties
such as ionization energy, electron affinity, and dissociation energies
are obtained using the high accuracy G4 (B3LYP-MP4-CCSD(T)) and CCSD(T)/CBS
(complete basis set up to n = 4) methods. Theoretical
heats of formation are close to each other and used to assess the
available experimental values. The growth mechanism for boron-doped
silicon clusters Si
n
B with n = 1–10 emerges as follows: (i) each Si
n
B cluster is formed by adding one excess Si-atom into the smaller
sized Si
n–1B, rather than by adding
B into Si
n
, (ii) a competition between
the exposed (exohedral) and enclosed (endohedral) structures occurs
at the size Si8B where both structures become close in
energy, and (iii) the larger size clusters Si9B and Si10B exhibit endohedral structures where the B-impurity is located
at the center of the corresponding Si
n
cages. The species Si9B–, Si9B, and Si10B+ are identified as enhanced stability
systems with larger average binding energies and embedded energies.
The higher stability of the closed shells Si9B– and Si10B+ can be rationalized in terms of
the jellium electron shell model and spherical aromaticity.