2021
DOI: 10.1103/physrevb.104.045429
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First-principles theory for Schottky barrier physics

Abstract: We develop a first-principles theory for Schottky barrier physics. The Poisson equation is solved completely selfconsistently with the electrostatic charge density and outside the normal density functional theory (DFT) electronic structure iteration loop, allowing computation of a Schottky barrier entirely from DFT involving thousands of atomic layers in the semiconductor. The induced charge in the bulk consists of conduction and valence band charges from doping and band bending, as well as charge from the eva… Show more

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Cited by 26 publications
(15 citation statements)
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“…The majority of carriers in SnO 2 /TiO 2 , which was an n-type Schottky heterojunction (Figure S11) semiconductor, were electrons . Heterojunction breakdown was utilized to promote carrier density in the sensor, , as shown in Figure S12.…”
Section: Results and Discussionmentioning
confidence: 99%
“…The majority of carriers in SnO 2 /TiO 2 , which was an n-type Schottky heterojunction (Figure S11) semiconductor, were electrons . Heterojunction breakdown was utilized to promote carrier density in the sensor, , as shown in Figure S12.…”
Section: Results and Discussionmentioning
confidence: 99%
“…In that regard, Kang et al [29] used the layered partial density of states (PDOS) to calculate the Schottky barrier considering the atomic orbital hybridization. Skachkov et al [30] carried out the detailed study on the Schottky barrier of graphene/semiconductor through calculating the PDOS.…”
Section: Introductionmentioning
confidence: 99%
“…Unlike traditional TFETs, which require doping to create p and n regions leading to P-I-N or P-N-N structures [14] [15], our proposed iTFET necessitates a one-time doping to convert the structure into a P ++ -type body. As a result of band bending, thermally activated electrics engender an inversion layer, which transmutes the drain region into an N-type [30], resulting in a comprehensive P ++ -N + structure that mitigates the effects of dopant diffusion [12] [13,[16][17][18]. Furthermore, we integrate a control gate between the source and drain to augment device performance [19][20][21].…”
Section: Introductionmentioning
confidence: 99%