2011
DOI: 10.1364/josaa.28.000263
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Fitting-determined formulation of effective medium approximation for 3D trench structures in model-based infrared reflectrometry

Abstract: The success of the model-based infrared reflectrometry (MBIR) technique relies heavily on accurate modeling and fast calculation of the infrared metrology process, which continues to be a challenge, especially for three-dimensional (3D) trench structures. In this paper, we present a simplified formulation for effective medium approximation (EMA), determined by a fitting-based method for the modeling of 3D trench structures. Intensive investigations have been performed with an emphasis on the generality of the … Show more

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Cited by 11 publications
(7 citation statements)
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“…As inferred from Figure b, a large fraction of the Ge film is consumed as reducing agent during Ag NHS synthesis (i.e., Galvanic displacement). Accordingly, we model the Ge layer as a porous medium and compute its dielectric function using dielectric mixing (i.e., Ge in vacuum) by zero-order effective medium approximation …”
Section: Results and Discussionmentioning
confidence: 99%
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“…As inferred from Figure b, a large fraction of the Ge film is consumed as reducing agent during Ag NHS synthesis (i.e., Galvanic displacement). Accordingly, we model the Ge layer as a porous medium and compute its dielectric function using dielectric mixing (i.e., Ge in vacuum) by zero-order effective medium approximation …”
Section: Results and Discussionmentioning
confidence: 99%
“…Accordingly, we model the Ge layer as a porous medium and compute its dielectric function using dielectric mixing (i.e., Ge in vacuum) by zero-order effective medium approximation. 25 The boundary conditions for the unit cell are employed to represent infinite repetition of NHSs in 2D. It is not a straightforward task to adopt an effective interparticle separation in our simulations.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…The in-house computer program used for data analysis is based on MATLABV R high-level language and interactive environment [version (R2013b), The MathWorks, Inc., Natick, MA, USA], which will be run on a 2.3 GHz Intel i5-2410M personal computer. Here, the in-house computer program mainly contains two parts, which are the forward modeling based on RCWA algorithm 8 and the inverse extraction based on least square regression 10,13 and robust estimation. 24,25…”
Section: Drc-mme In Order Of Light Propagation Is Pcr 1 Scr 2 Amentioning
confidence: 99%
“…The inherent essence of nonlinear regression is that the profile parameters are achieved through an iterative procedure, which repeatedly requires computation of the forward modeling. 13 Since the relationship between the optical signature and the profile parameters is highly nonlinear, the forward modeling procedure is usually time-consuming, and it will be even worse and unacceptable for two-dimensional or more complex nanostructure measurements. Hence, the nonlinear regression method is rarely used in the in-line monitoring of the complex nanostructure fabrications.…”
Section: Introductionmentioning
confidence: 99%
“…There are many reliable forward-modeling techniques such as the rigorous coupled-wave analysis (RCWA), the finite element method (FEM), the boundary element method (BEM), or the finite-difference time-domain (FDTD) method. The profile 2 of 12 reconstruction process conducted under a fixed measurement configuration is an inverse problem with the objective of optimizing a set of floating profile parameters (e.g., CD, sidewall angle, and height) whose theoretical signatures can best match the measured ones through regression analysis or library search [12][13][14]. The measurement configuration is defined as a combination of specially selected wavelengths and incident and azimuthal angles.…”
Section: Introductionmentioning
confidence: 99%