Fixed-height exit bender of synchrotron X-rays above 40 keV

Abstract

A crystal bender for sagittal focusing has been designed for standard monochromators at SPring-8. The bender does not move the position of the crystal center when the bending radius is changed. Sagittal focusing from 40 keV to 60 keV was achieved by using Si(311) double crystals. The¯ux density of the focused beam measured at 40 keV was 15 times higher than that of the unfocused beam. The height deviation of the focused beam throughout the measured energy range was within AE0.15 mm.

Formation and crystal growth process of AlH3 in Al–H system

“…We developed an angle-dispersive X-ray diffraction (ADX) system for the present study, in which the ADX system [11] was combined with sagittally focused incident X-rays [12]. The energy dispersive X-ray diffraction (EDX) method, which is a standard technique for high-pressure experiments with a multianvil press, allows acquisition of diffraction data from a very limited reciprocal lattice space [11].…”

X-ray Diffraction from the Ferroelectric Fluctuation and Domain Walls of Barium Titanate

“…The incident X-ray beam was focused on the samples by using a bent crystal [15,16]. Samples of about 0.2 g were sealed between Kapton foils for the low-temperature data correction and were sealed in a quartz tube for the high-temperature data correction.…”

<I>In Situ</I> X-ray Diffraction Measurements of Aluminum Pulverization prior to the Hydrogenation Reaction

“…Hence, we developed a new ADX system for the present study using sagittally focused monochromatic X-rays as the incident beam 13) to increase the intensities of the diffracted X-rays as well as to decrease the exposure time of the ADX measurements. Figure 2 schematically depicts the experimental setup.…”