Flash Oxide Scalability Model and Impact of Program/Erase Method

Haggag, A.; Kuhn, P.; Ingersoll, P.; Li, Chi-nan; Harp, T.; Hoefler, A.; Burnett, D.; Baker, K.; Chang, Ko-Min

doi:10.1109/irws.2006.305214

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Flash Oxide Scalability Model and Impact of Program/Erase Method

Cited by 6 publications

References 6 publications

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