2019
DOI: 10.1088/2053-1591/ab3241
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Flexoelectric and local heating effects on CdSe nanocrystals in amorphous As2Se3 films

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Cited by 8 publications
(17 citation statements)
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“…Such assumption is quite reasonable because for amorphous As 2 Se 3 and As 2 S 3 films, it is well known that under illumination by a tightly focused laser beam at such power densities, the film viscosity drastically decreases and the film material moves away from the laser spot with a pit in its center being formed, clearly confirmed by AFM, scanning electron microscopy (SEM), and optical microscopy. [ 18–20,45 ] In our case, the formation of such a pit is confirmed by optical images as well as by the Raman peak from the silicon substrate (521 cm −1 ) emerging in the spectra at high P exc ≥ 420 kW/cm 2 because of a reduced As–Se–S:Cd film thickness (Fig. 3).…”
Section: Resultssupporting
confidence: 71%
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“…Such assumption is quite reasonable because for amorphous As 2 Se 3 and As 2 S 3 films, it is well known that under illumination by a tightly focused laser beam at such power densities, the film viscosity drastically decreases and the film material moves away from the laser spot with a pit in its center being formed, clearly confirmed by AFM, scanning electron microscopy (SEM), and optical microscopy. [ 18–20,45 ] In our case, the formation of such a pit is confirmed by optical images as well as by the Raman peak from the silicon substrate (521 cm −1 ) emerging in the spectra at high P exc ≥ 420 kW/cm 2 because of a reduced As–Se–S:Cd film thickness (Fig. 3).…”
Section: Resultssupporting
confidence: 71%
“…It is known from our earlier studies of As 2 Se 3 and As 2 S 3 films that the depth of the pit on the surface at such P exc values typically reaches 400–500 nm [ 18,20,45 ] and a rim as high as 80 nm is formed around the pit on the film surface extending by several micrometers. [ 19,45 ] The pit formation is caused not by photoinduced or thermoinduced ablation (evaporation of the film material) but by a non‐thermal effect—intense directional material transfer due to the strong gradient of illuminance. There can be no doubt that at the high‐ P exc Raman measurement, the illumination‐induced local photofluidity in the laser spot leads to a strong and rapid mixing of the As 2 (Se 0.5 S 0.5 ) 3 :Cd film material, which destroys the surface layer initially containing CdS 1– x Se x crystallites.…”
Section: Resultsmentioning
confidence: 99%
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