2022
DOI: 10.48550/arxiv.2212.11164
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Flip-chip-based microwave spectroscopy of Andreev bound states in a planar Josephson junction

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(3 citation statements)
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“…The smoothness of the SE surface in the HAADF STEM image indicates that the presence of the boundary is not associated with neither a surface step nor a crystallographic defect in the semiconductor. These partially polycrystalline Al films performed consistently with previous reports in literature in our transport experiments which rely on the combined SE/SC system [30][31][32][33]. On the other hand, consistent results were achieved only when processing temperatures did not exceed 175 • C. This is due to degradation of both the Al film and the SE/Al interface, which was investigated by in-situ annealing of a lamella prepared from the standard material in a scanning transmission electron microscope.…”
Section: Al Thin Filmssupporting
confidence: 89%
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“…The smoothness of the SE surface in the HAADF STEM image indicates that the presence of the boundary is not associated with neither a surface step nor a crystallographic defect in the semiconductor. These partially polycrystalline Al films performed consistently with previous reports in literature in our transport experiments which rely on the combined SE/SC system [30][31][32][33]. On the other hand, consistent results were achieved only when processing temperatures did not exceed 175 • C. This is due to degradation of both the Al film and the SE/Al interface, which was investigated by in-situ annealing of a lamella prepared from the standard material in a scanning transmission electron microscope.…”
Section: Al Thin Filmssupporting
confidence: 89%
“…Overall, we found that all three material designs exhibited a highly transparent interface, gap size comparable to the BCS theory and other reports in literature, signatures of coherent ballistic transport through a JJ and a good performance in our other experiments focused on InAs/Al hybrids [31][32][33]. In addition, studying differently designed material structures implemented into hybrid devices is important for further understanding of the influence of individual material parameters on transport properties.…”
Section: Effect Of Roughening On Transport Propertiessupporting
confidence: 85%
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