“…As discussed previously [37], in the analysis of photoluminescence of solid films, it must be considered the absorption of both the excitation and emission beams by the film material, as well as the reflective properties of the supporting surface in order to have quantitatively correct results. When a fluorescent film of thickness L, supported on a reflective surface, is irradiated with an excitation beam of intensity I 0 (of wavelength k 0 ), the corrected emission intensity I m,c is related to the intensity measured at the detector I m , at a given emission wavelength k e , by where f 0 and f e are the metal reflectance values at k 0 and k e respectively, a 0 and a e are the respective absorption coefficients, h 0 is the incidence angle of I 0 and h e is the angle of emission [37].…”