2009
DOI: 10.1021/am800205d
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Focused-Ion-Beam-Assisted Magnet Fabrication and Manipulation for Magnetic Field Detection Applications

Abstract: The effect of synthesis conditions and . . . AbstractElectrochemically produced ZnO/metal rectifying (Schottky) junctions can exhibit consistent barrier heights and high rectifying ratios when prepared using optimized electrolyte pH (6.5) and applied voltage (≤-1.1 V vs. Ag/AgCl) conditions. An increase in soft breakdown for more acidic deposition electrolytes (pH 4) correlates with a diminished preferred orientation in the resulting ZnO electrodeposit. Forward-biased junctions exposed to increased relative hu… Show more

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Cited by 5 publications
(4 citation statements)
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“…A Raith's Elphy Quantum routine changing both Ga + ion doses and ion beam currents is employed to complete the process. The technology for producing top-down nanomagnets is an extension of the FIB-milling-and-deposition process sequence previously reported by our group for micromagnet preparation and manipulation [1]. Current extension of technology comprises: (a) extraction of high-aspect-ratio nanomagnets from an NdFeB quarry and (b) sharpening of the nanomagnet tip down to 20 nm once attached to Si MEMS cantilevers.…”
Section: Focused-ion-beam-assisted Nanomagnet Fabricationmentioning
confidence: 99%
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“…A Raith's Elphy Quantum routine changing both Ga + ion doses and ion beam currents is employed to complete the process. The technology for producing top-down nanomagnets is an extension of the FIB-milling-and-deposition process sequence previously reported by our group for micromagnet preparation and manipulation [1]. Current extension of technology comprises: (a) extraction of high-aspect-ratio nanomagnets from an NdFeB quarry and (b) sharpening of the nanomagnet tip down to 20 nm once attached to Si MEMS cantilevers.…”
Section: Focused-ion-beam-assisted Nanomagnet Fabricationmentioning
confidence: 99%
“…Thus, we implemented a set-up consisting of the non-sharpened magnet integrated to a silicon cantilever and mounted in the AFM head, and a coil excited with DC current to observe cantilever deflections. Following this technique, we extracted magnetic moments (M = 2.1 × 10 5 A m −1 or J = 0.264 T) [1]. Due to the detection limit of the AFM set-up and the cantilever's mechanical constants, the technique finds its limits to micromagnet moment characterization.…”
Section: Focused-ion-beam-assisted Nanomagnet Fabricationmentioning
confidence: 99%
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“…a lowered magnetic sensitivity. Thicker coatings, or hard magnetic materials, produce a larger magnetic moment 1,[16][17][18][19][20] that improves the magnetic sensitivity and the probe's resilience to magnetic perturbations, but at the cost of a dramatic increase of its interaction with the sample's magnetization and a loss in resolution due to the increased physical radius of the probe's apex.…”
mentioning
confidence: 99%