“…Dual beam instruments that combine focused ion beam with a scanning electron microscope (FIB‐SEM) are extensively used for characterization of various materials ranging from semiconductors to biological tissue (Stevie et al ., ; Volkert & Minor, ; Bassim et al ., ), but have not been applied to analysis of organic corrosion barrier coatings. In the past, FIB‐SEM has been used for site specific cross sectioning and/or lamella extraction for transmission electron microscope imaging (White et al ., ; Lins et al ., ; Loos et al ., ; Beach et al ., ; Brunner et al ., , ; Brostow et al ., ; Kawahara et al ., ; Martínez et al ., ; Wong et al ., ; Firpo et al ., ; Qin et al ., ), destructive tomography (Kato et al ., ; Lin et al ., ; Olea‐Mejía et al ., ) and nanofabrication (Aubry et al ., ; Niihara et al ., ; Lee et al ., ; Schmied et al ., ; Orthacker et al ., ; Schmied et al ., ) of polymers and polymeric composites. Out of these examples, only a few studies have been dedicated to characterization of pristine organic coatings and paints (Lins et al ., ; Brunner et al ., , ; Brostow et al ., ; Lin et al ., ; Chen et al ., ; Doutre et al ., ).…”