2020 23rd International Microwave and Radar Conference (MIKON) 2020
DOI: 10.23919/mikon48703.2020.9253857
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Fork-Coupled Resonators for Characterization of Mold Material for 5G Applications

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Cited by 7 publications
(2 citation statements)
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“…On top of the RDL, an EMC of 300 µm thickness is applied being metallised with another Cu layer of 3 µm thickness (Cu Layer 1). The PI material was characterized using the procedure described in [16] with corresponding dielectric permittivity εr,PI = 3.5 and dielectric loss tanδPI = 0.008 at 12 GHz. Similarly, the EMC properties were extracted at 12 GHz yielding the permittivity εr,EMC = 3.66 and the dielectric loss tanδ EMC = 0.004.…”
Section: B Stack-up and Materialsmentioning
confidence: 99%
“…On top of the RDL, an EMC of 300 µm thickness is applied being metallised with another Cu layer of 3 µm thickness (Cu Layer 1). The PI material was characterized using the procedure described in [16] with corresponding dielectric permittivity εr,PI = 3.5 and dielectric loss tanδPI = 0.008 at 12 GHz. Similarly, the EMC properties were extracted at 12 GHz yielding the permittivity εr,EMC = 3.66 and the dielectric loss tanδ EMC = 0.004.…”
Section: B Stack-up and Materialsmentioning
confidence: 99%
“…This is because it has the advantages of simpler process, lower cost, and lighter weight. In plastic IC packaging, most of the materials are epoxy polymer [ 2 , 3 , 4 , 5 , 6 , 7 , 8 , 9 ]. Moisture adsorbed by the epoxy polymer can result in delamination, aging, and popcorn problems under high temperature [ 10 , 11 , 12 , 13 , 14 , 15 , 16 ].…”
Section: Introductionmentioning
confidence: 99%