2004
DOI: 10.1002/adma.200400760
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Form and Function in Multilayer Assembly: New Applications at the Nanoscale

Abstract: New frontiers in materials and polymer science include the development of assembly processes that are flexible, allow the access and implementation of nanoscale structure and order, can provide access to a broad range of materials systems, and yet can be implemented at relatively low cost. The ability to fine tune the composition of nanostructured thin films on the nanometer length scale, when combined with inexpensive patterning and templating routes, provides a powerful tool for nano‐ and microscale assembly… Show more

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Cited by 1,194 publications
(1,031 citation statements)
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References 178 publications
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“…For the (1/SPS) 4 (2/SPS) 4 film, thickness increased linearly for the deposition of the first four 1/SPS bilayers and continued to increase with the same slope (6.4 nm/layer) during the deposition of the final four 2/SPS layers to give a final film thickness of 70 nm. In contrast, the slope of the growth profile for the (2/SPS) 4 (1/SPS) 4 film changed during the deposition of the final four 1/SPS layers (from 6.4 nm/layer to 4.0 nm/layer), resulting in a final film thickness that was lower (10 nm less) than the (1/SPS) 4 (2/SPS) 4 film. In addition, visual inspection of (2/SPS) 4 (1/SPS) 4 films indicated the presence of non-uniform optical patterns and irregular film coverage over large areas of the silicon substrate.…”
Section: Investigation Of Multilayered Films Fabricated From Multiplementioning
confidence: 92%
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“…For the (1/SPS) 4 (2/SPS) 4 film, thickness increased linearly for the deposition of the first four 1/SPS bilayers and continued to increase with the same slope (6.4 nm/layer) during the deposition of the final four 2/SPS layers to give a final film thickness of 70 nm. In contrast, the slope of the growth profile for the (2/SPS) 4 (1/SPS) 4 film changed during the deposition of the final four 1/SPS layers (from 6.4 nm/layer to 4.0 nm/layer), resulting in a final film thickness that was lower (10 nm less) than the (1/SPS) 4 (2/SPS) 4 film. In addition, visual inspection of (2/SPS) 4 (1/SPS) 4 films indicated the presence of non-uniform optical patterns and irregular film coverage over large areas of the silicon substrate.…”
Section: Investigation Of Multilayered Films Fabricated From Multiplementioning
confidence: 92%
“…In contrast, the slope of the growth profile for the (2/SPS) 4 (1/SPS) 4 film changed during the deposition of the final four 1/SPS layers (from 6.4 nm/layer to 4.0 nm/layer), resulting in a final film thickness that was lower (10 nm less) than the (1/SPS) 4 (2/SPS) 4 film. In addition, visual inspection of (2/SPS) 4 (1/SPS) 4 films indicated the presence of non-uniform optical patterns and irregular film coverage over large areas of the silicon substrate. By contrast, (1/SPS) 4 (2/SPS) 4 films were smooth and uniform (RMS roughness was 3.3 nm as determined by atomic force microscopy).…”
Section: Investigation Of Multilayered Films Fabricated From Multiplementioning
confidence: 95%
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“…This is especially true for the field of materials with biological or pharmaceutical applications in which processes such as cell adhesion and tissue growth, gene transfection or drug delivery require control of complex dynamics and transport kinetics [1][2][3][4].…”
Section: Introductionmentioning
confidence: 99%