2009
DOI: 10.1016/j.jallcom.2008.09.001
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Formation of intermetallic compounds in SnAgBiIn solder systems on Cu substrates

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Cited by 23 publications
(9 citation statements)
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“…The interfacial reaction between solder and Cu is necessary to form IMC to make strong metallurgical bonding, when the components are reflowed. Many papers [5][6][7][8][9][10] have indicated that the IMC Cu 6 Sn 5 ( phase) develops and Cu 3 Sn ( phase) forms between Cu 6 Sn 5 and Cu substrate, when the interconnect is aged at a higher homologous temperature. But excessive growth of the IMC during the service of the electronic components may undermine the joint to make the components fail, because of the brittleness of IMCs.…”
Section: Introductionmentioning
confidence: 99%
“…The interfacial reaction between solder and Cu is necessary to form IMC to make strong metallurgical bonding, when the components are reflowed. Many papers [5][6][7][8][9][10] have indicated that the IMC Cu 6 Sn 5 ( phase) develops and Cu 3 Sn ( phase) forms between Cu 6 Sn 5 and Cu substrate, when the interconnect is aged at a higher homologous temperature. But excessive growth of the IMC during the service of the electronic components may undermine the joint to make the components fail, because of the brittleness of IMCs.…”
Section: Introductionmentioning
confidence: 99%
“…These bright particles have also been found in Sn-Ag-Bi-In solder, and are also identified as the f-phase. 15,16 These results suggest that f-phase particles are the most stable IMCs that form in Sn-Ag-In solder reactions with Cu substrates, regardless of whether Bi is present.…”
Section: F-phasementioning
confidence: 78%
“…15,16 This paper first discusses the effect of composition on the thermal properties of Sn-Ag-In, Sn-Ag-Bi, and Sn-Ag-Bi-In solders. Second, the interfacial reactions of Sn-Ag-Bi and Sn-Ag-In solders on Cu substrates and the growth kinetics of the interfacial IMCs are investigated.…”
Section: Introductionmentioning
confidence: 99%
“…These voids caused by the unbalanced inter-diffusion ofcopper and tin at the interface between substrates and solder [10]. According to Schueller [79] and Yau et al [78], the formation of microvoids caused by cavities or empty bubbles in the copper (the source of the microvoids upon reflow) It is happened because of the interaction between silver and copper during silver plating process [11,75,76].…”
Section: Solder Joint Microstructure Of Immersion Silvermentioning
confidence: 99%