Four-probe electrical transport measurements on individual metallic nanowires

Abstract

This work presents nanoscale four-probe measurements on metallic nanowires using independently controlled scanning tunnelling microscope tips. This technique has allowed us to follow the change in resistance with probe separation. Gold, zinc and nickel nanowires were grown by electrodeposition within porous polycarbonate membranes. Their structure and composition were studied by transmission electron microscopy. Four-probe electrical transport measurements were taken using four independently controlled scanning tunnelling microscope tips positioned using a high resolution scanning electron microscope. Multiple I–V measurements were taken at varying tip separations, on each nanowire, and the change in resistance with separation was observed to be in good agreement with predictions based on the nanowire geometry. The resistivity values of the nanowires were found to be close to bulk values.

Structural and electrical properties of gold nanowires/P(VDF-TrFE) nanocomposites

“…Assuming that this extrapolation is correct, the electrical conductivity of Au nanowire is 72.10 6 S.m -1 . This value is consistent with other observations for bulk (45.10 6 Sm -1 ) and with four-probe measurements on Au nanowires [22]. Figure 4 shows DSC curves of Au NW/P(VDF-TrFE) nanocomposites recorded during cooling scans.…”

An investigation of the growth of bismuth whiskers and nanowires during physical vapour deposition

“…To investigate the transport properties of the whiskers, a film grown on silicon was analysed in an Omicron Nanoprobe [22] based in the Leeds EPSRC National Nanoscience Facility at Leeds University. This device enables four-point measurements to be made on the nano-to micro-scale.…”

Near‐Bulk Conductivity of Gold Nanowires as Nanoscale Interconnects and the Role of Atomically Smooth Interface

“…In this study, we tried to answer these questions by making exceptionally long pentahedrally twinned Au NWs and carried out transport measurements using a multi-probe scanning tunneling microscope (STM) technique. [29] The conductivity of these NWs was analyzed with respect to the bulk metal. Application of a theoretical approach allows one to identify important physical properties that metallic interconnects require for achieving low resistivity.…”

“…[29] MPSTM transport measurements require long and sharp STM tips to achieve close proximately ( Fig. 2A).…”

“…[27,28] One of the advantages of the MPSTM technique is the possibility of plotting resistance against sensing tip separation, allowing one to calculate the resistivity of NWs using several measurements. [26,29,36] Resistance versus probe separation data for the 92-nm and 185-nm diameter Au NWs are shown in Figure 2C, which correspond to resistivities of 2.19 AE 0.06 mV.cm and 2.1 AE 0.2 mV.cm, respectively, i.e. corresponding to bulk gold.…”