Fourier Images IV: The Phase Grating

Cowley, J. M.; Moodie, A. F.

doi:10.1088/0370-1328/76/3/308

Cited by 138 publications

(81 citation statements)

References 10 publications

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“…The magnification M (M= 1 + fdf2, wheref~ and f2 are the distance of the object from the image and source respectively) is approximately unity in electron microscopy. Cowley & Moodie (1960a) further showed that as a corollary to the formation of Fourier images, the intensity distribution at image planes close to those of the Fourier images is given by…”

Section: The Charge-density Approximationmentioning

confidence: 99%

The direct observation of the structure of real crystals by lattice imaging

Allpress¹,

Sanders²

1973

J Appl Cryst

160

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The electron-microscope technique of lattice imaging can in favourable circumstances be used to observe the structure of materials directly. The technique is described, and examples of cases in which a direct correlation between image contrast and structural features has been established are given. Procedures for computing contrast in n-beam lattice images are outlined, and the important experimental parameters, thickness and orientation of the specimen, and spherical aberration and defocusing of the microscope objective, are discussed in some detail.

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Section: The Charge-density Approximationmentioning

confidence: 99%

The direct observation of the structure of real crystals by lattice imaging

Allpress¹,

Sanders²

1973

J Appl Cryst

160

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“…Fourier images, in the terminology of Cowley & Moodie, (1960)] were recorded at regular 10 mm intervals of defocus. The original * If a planar object with a periodic transmission function of repeat distance a is illuminated with parallel light, as is effectively the case for the optical device above, a series of images with the same intensity distribution as at the exit face of the object will appear at defects of focus Af= na2/,l, where n is an even integer, i.e.…”

Section: Optical Processingmentioning

confidence: 99%

Disclosure of domain structure in cubic Ca_xZr_1−xO_2−x, 0.15 ≤ x ≤ 0.20, by Talbot image enhancement of high-resolution electron micrographs

Rossell¹,

Sellar²,

Wilson³

1991

Acta Crystallogr Sect B

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High-resolution electron microscope images have been recorded of several crystalline samples of calciastabilized zirconia (Ca-CSZ) and of the fluoriterelated superstructure phase ~o, (CaZr4Og). The contrast of the CSZ images has been enhanced markedly by the light-optical Talbot self-imaging technique. It is demonstrated that the CSZ crystals contain a coherent dispersion of microdomains approximately 30 A in diameter, and that the structure of the microdomains is that of ~o~.

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“…Since the largest corrections are for V(000), these corrections will appear as an artificial enhancement of the outer bonding-electron density (Becker & Coppens, 1990;Spence & Zuo, 1992). For an object whose transmission function is a phase grating, source and detctor positions can be found such that the Fourier images directly resemble the projected charge density in the crystal (Cowley & Moodie, 1960). Fig.…”

Section: Discussion and Concluding Remarksmentioning

confidence: 99%

“…l(a) shows the geometry of our variant of the field-emission point-projection electron microscope (Fink et al, 1991). If the angular range (measured at the sample) over which the electron beam is coherent exceeds the Bragg angle and if the sample is periodic, a Fourier image (Cowley & Moodie, 1960) forms on a distant screen. This is an unaberrated image of the periodic component of the wavefield ~(1) shown across the exit face of the crystal.…”

Section: Introductionmentioning

confidence: 99%

Transmission low-energy electron diffraction (TLEED) and its application to the low-voltage point-projection microscope

Qian¹,

Spence²,

Zuo³

1993

Acta Cryst Sect A

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Solutions to the mixed Bragg-Laue case for transmission low-energy electron diffraction (TLEED) are derived for thin crystalline slabs and applied to the low-voltage (0-1 kV) field-emission point-projection transmission microscope [Fink, Schmid, Kreuzer & Wierbicki (1991). Phys. Rev. Lett. 67, 1543Lett. 67, -1546.Absorption due to inelastic scattering, exchange and virtual inelastic scattering effects are considered. The relationship between Fourier imaging, shadow imaging, holography of extended objects and holography of small objects is briefly discussed, together with the optimum energy for atomic-resolution electron microscopy and holography. The importance of multiple scattering in transmission-electron interference patterns obtained at LEED energies with spherical-wave illumination is evaluated and the nature of the optical potential that might be recovered holographically is discussed.

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Fourier Images IV: The Phase Grating

Cited by 138 publications

References 10 publications

The direct observation of the structure of real crystals by lattice imaging

The direct observation of the structure of real crystals by lattice imaging

Disclosure of domain structure in cubic Ca_xZr_1−xO_2−x, 0.15 ≤ x ≤ 0.20, by Talbot image enhancement of high-resolution electron micrographs

Transmission low-energy electron diffraction (TLEED) and its application to the low-voltage point-projection microscope

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Fourier Images IV: The Phase Grating

Cited by 138 publications

References 10 publications

The direct observation of the structure of real crystals by lattice imaging

The direct observation of the structure of real crystals by lattice imaging

Disclosure of domain structure in cubic Ca x Zr1−x O2−x , 0.15 ≤ x ≤ 0.20, by Talbot image enhancement of high-resolution electron micrographs

Transmission low-energy electron diffraction (TLEED) and its application to the low-voltage point-projection microscope

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Disclosure of domain structure in cubic Ca_xZr_1−xO_2−x, 0.15 ≤ x ≤ 0.20, by Talbot image enhancement of high-resolution electron micrographs