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High-resolution electron microscope images have been recorded of several crystalline samples of calciastabilized zirconia (Ca-CSZ) and of the fluoriterelated superstructure phase ~o, (CaZr4Og). The contrast of the CSZ images has been enhanced markedly by the light-optical Talbot self-imaging technique. It is demonstrated that the CSZ crystals contain a coherent dispersion of microdomains approximately 30 A in diameter, and that the structure of the microdomains is that of ~o~.

We describe a technique for determining the groove depth of gratings having sinusoidal grooves. Absolute efficiencies measured using a laser are compared with numerical results to give an indication of groove depth.

Optical transforms from a through focal series of images of amorphous films of Ge were used to measure the spatial frequencies of maximum and minimum phase contrast of a specific 200 kV lEOL electron microscope. This information was used to determine precise values for the spherical aberration coefficient and defect of focus. Under the appropriate conditions of lens excitation the spherical aberration coefficient was found to be as low as 0·94 mm. Other image defects revealed with great precision were associated with astigmatism, beam divergence and specimen drift in the microscope stage. Quantitative examples illustrating these effects are discussed.