“…However, this already leads to one of the main shortcomings of these techniques when used for low-emittance samples because a small relative error in the measured reflectance results inevitably in a significantly larger relative error in emittance [9]. Nevertheless, there are various absolute and relative techniques used to measure the spectral bidirectional, spectral directional-hemispherical or spectral hemispherical-directional reflectance using monochromatic or polychromatic light sources [2,7,[10][11][12][13][14][15]. Here, we use the term "spectral" to refer to the reflectance or emittance at a single wavelength, as opposed to the term "total" which refers to the property averaged over a given spectrum (e.g.…”