Fourier transform spectroscopy applied to photoluminescence: Advantages and warnings

Bignazzi, A.; Grilli, E.; Radice, Marcela; Guzzi, M.; Castiglioni, Enrique

doi:10.1063/1.1146839

Cited by 18 publications

(7 citation statements)

References 7 publications

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“…Therefore, through the appropriate selection of the wavelength span even weaker PL could appear as far as it still exceeds the detection threshold of the FTIR. 16 The zoom in of PL of sample b (a quaternary InAlGaAs layer) with quite weak intensity was also shown in Fig. 1, in this case the PL still could be seen clearly but with a low signal noise ratio (S/N) of only about 2.8.…”

Section: Demonstration and Discussionmentioning

confidence: 62%

“…For conventional RS mode, some advantages and warnings of FTIR-PL have been reviewed. 16 Turning into MIR the thermal background arouses. For 300 K background, the radiation is peaked at ∼1035 cm −1 , with magnitude greater than 0.1%, 1% or 10% of the peak at ∼3831, ∼3144, and ∼2375 cm −1 from short wavelength side, respectively, the long wavelength tail extends to far-infrared.…”

Section: Ftir-pl Consideration and Configurationmentioning

confidence: 99%

“…However, for most subsequent instruments an emission port also has been introduced, through this port the spectral features of materials and devices from external emission source, such as photoluminescence (PL) or electroluminescence (EL), could also be characterized. Based on this arrangement, accessional user configurations for different approaches have to be developed, [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16] whereas commercial PL or EL accessory is still rare.…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Fourier transform infrared spectroscopy approach for measurements of photoluminescence and electroluminescence in mid-infrared

Zhang

Yuan

Wang

et al. 2012

Review of Scientific Instruments

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An improved Fourier transform infrared spectroscopy approach adapting to photoluminescence and electroluminescence measurements in mid-infrared has been developed, in which diode-pumped solid-state excitation lasers were adopted for photoluminescence excitation. In this approach, three different Fourier transform infrared modes of rapid scan, double modulation, and step scan were software switchable without changing the hardware or connections. The advantages and limitations of each mode were analyzed in detail. Using this approach a group of III-V and II-VI samples from near-infrared extending to mid-infrared with photoluminescence intensities in a wider range have been characterized at room temperature to demonstrate the validity and overall performances of the system. The weaker electroluminescence of quantum cascade lasers in mid-infrared band was also surveyed at different resolutions. Results show that for samples with relatively strong photoluminescence or electroluminescence out off the background, rapid scan mode is the most preferable. For weaker photoluminescence or electroluminescence overlapped with background, double modulation is the most effective mode. To get a better signal noise ratio when weaker photoluminescence or electroluminescence signal has been observed in double modulation mode, switching to step scan mode should be an advisable option despite the long data acquiring time and limited resolution.

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Section: Demonstration and Discussionmentioning

confidence: 62%

Section: Ftir-pl Consideration and Configurationmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Fourier transform infrared spectroscopy approach for measurements of photoluminescence and electroluminescence in mid-infrared

Zhang

Yuan

Wang

et al. 2012

Review of Scientific Instruments

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“…It can not only reveal materials' electronic band structures such as band gap and band-tail states but also provide perspective to impurities and deep-level defects. 1 Profiting from the well-known multiplexing advantage of using a single detector to measure all of the signals simultaneously and throughput advantage of sharing noise from this detector among all of the recorded signals equally, 2,3 Fourier transform infrared ͑FTIR͒ spectrometer based PL spectroscopy 4 has found fruitful applications, especially in the areas where the traditional dispersive spectrometer could not operate effectively. However, it suffers from internal He-Ne laser disturbance in the near-infrared ͑NIR͒ spectral region, due to its intrinsic limitation.…”

Section: Introductionmentioning

confidence: 99%

Modulated photoluminescence spectroscopy with a step-scan Fourier transform infrared spectrometer

Shao

Lü

et al. 2006

Review of Scientific Instruments

113

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Fourier transform infrared ͑FTIR͒ spectrometer is a powerful tool for studying the photoluminescence ͑PL͒ properties of semiconductors, due to its well-known multiplexing and throughput advantages. However, it suffers from internal He-Ne laser disturbance in near-infrared and/or environmental background thermal emission in mid-and far-infrared spectral regions. In this work, a modulated PL technique is developed based on step-scan ͑SS͒-FTIR spectrometer. Theoretical analysis is conducted, and applications of the technique are given as examples in the PL study of mid-infrared HgCdTe thin films and near-infrared GaInP / AlGaInP multiple quantum wells, respectively. The results indicate that the He-Ne laser and/or thermal emission disturbance can be reduced at least 1 / 1000 and/or even 1 / 10 000, respectively, by the modulated SS-FTIR PL technique, and hence a rather smooth PL spectrum can be obtained even under room temperature for HgCdTe thin films. A brief comparison is given of this technique with previously reported phase-sensitive modulation methods based on conventional rapid-scan ͑RS͒-FTIR spectrometer, and the advantages of this technique over the former RS-FTIR-based ones are emphasized.

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“…For application in infrared, a continuous-scan Fourier Transform Infrared (csFTIR) spectrometer is usually employed, due to its wellknown multiplexing advantage of using a single detector to measure all of the signals simultaneously and throughput advantage of sharing noise among all of the recorded signals equally. [2][3][4] It suffers, however, from environmental thermal emission. To eliminate the disturbance, double-modulation csFTIR PL techniques were developed in 1980's.…”

Section: Introductionmentioning

confidence: 98%

Arsenic-doped narrow-gap HgCdTe epilayers studied by infrared modulation spectroscopy

Shao

Lü

Chen

et al. 2010

Seventh International Conference on Thin Film Physics and Applications

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We outline experimental data recently established in our study of in-situ arsenic (As) doped narrow-gap Hg 1-x Cd x Te films by infrared modulation spectroscopy. After a brief introduction of the step-scan Fourier transform infrared spectrometer-based modulation spectroscopic techniques, impurity levels and photomodulation mechanisms in As-doped HgCdTe epilayers are surveyed based on infrared modulation spectroscopic data, and the possibility of identifying cutoff wavelength and vertical uniformity of HgCdTe epilayers is indicated. The results illustrate that the infrared modulation spectroscopy will play an important role in optical characterization of narrow-gap semiconductors.

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Fourier transform spectroscopy applied to photoluminescence: Advantages and warnings

Cited by 18 publications

References 7 publications

Fourier transform infrared spectroscopy approach for measurements of photoluminescence and electroluminescence in mid-infrared

Fourier transform infrared spectroscopy approach for measurements of photoluminescence and electroluminescence in mid-infrared

Modulated photoluminescence spectroscopy with a step-scan Fourier transform infrared spectrometer

Arsenic-doped narrow-gap HgCdTe epilayers studied by infrared modulation spectroscopy

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