Fractal Analysis of AFM Data Characterizing Strongly Isotropic and Anisotropic Surface Topography

Bramowicz, Mirosław; Kulesza, Sławomir; Lipiński, T.; Szabracki, Paweł; Piątkowski, Paweł

doi:10.4028/www.scientific.net/ssp.203-204.86

Cited by 32 publications

(21 citation statements)

References 6 publications

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“…Scanning with atomic force microscope (AFM) allowed us to reconstruct 3-dimensional surface maps, which were further processed to determine various spatial characteristics: statistical (root mean square (RMS) roughness, anisotropy ratio), fractal (fractal dimension, corner frequency) and functional (kernel roughness, peak height) at various wavelengths [8,9]. AFM measurements were carried out using Multimode 8 instrument (Bruker) in a PeakForce QNM proprietary mode with a scan size from 5 to 50 µm on the top surface of the implants.…”

Section: Methodsmentioning

confidence: 99%

Application of Atomic Force Microscopy for Studies of Fractal and Functional Properties of Biomaterials

et al. 2016

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The paper presents results of numerical analysis of AFM images of a surface of sandblasted Ti6Al7Nb alloys before and after wet etching procedure usually used for preparing commercially viable dental implants. Obtained results demonstrate that etching procedure efficiently cleans the implants as it leaves almost pure Ti-Al-Nb surface with trace amounts of alkali metals and increased hydrophobicity. Apart of that, it turned out that simple statistical measures of the height variations (root mean square roughness) only slightly change upon the treatment procedure, especially for scan lengths below 20 µm. On the other hand, correlation analysis exhibits bifractal surface patterns composed of regular residues left on otherwise helical ridges of the base material. Etching leaves its fingerprint in fractal dimension, but not in the corner frequency.

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Section: Methodsmentioning

confidence: 99%

Application of Atomic Force Microscopy for Studies of Fractal and Functional Properties of Biomaterials

et al. 2016

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“…In literature, there are different computing methods to estimate the fractal dimension [15,[20][21][22][23]. In this study, the fractal analysis was applied to the original AFM files using the cube counting method (derived directly from a definition of box-counting fractal dimension) with a linear interpolation type [36].…”

Section: Fractal Analysis Of the Cu Thin Film 3-d Surfacementioning

confidence: 99%

“…It is known that engineering surfaces are often random, isotropic or anisotropic, and either Gaussian or non-Gaussian [14,15]. Different studies about the characterization of 3-D surface morphology of thin films have been reported in the literature [16][17][18][19][20], and in several of them, the 3-D topography of thin films obtained from AFM data have been characterized in terms of fractal [20][21][22][23] and multifractal [24][25][26][27][28] geometry.…”

Section: Introductionmentioning

confidence: 99%

Micromorphology characterization of copper thin films by AFM and fractal analysis

Arman

Ţălu

Luna

et al. 2015

J Mater Sci: Mater Electron

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In this study, Cu thin films with layer thicknesses of 5, 25, and 50 nm were prepared by DC magnetron-sputtering method and their three dimensional (3-D) surface topography were investigated. Concretely, the 3-D surface roughness of samples was studied by atomic force microscopy (AFM), fractal analysis of the 3-D AFM-images and power spectral density (PSD) function. Also the content of thin films was characterized by X-ray diffraction (XRD). The thin films were prepared onto glass and p-type silicon (100) substrates by DC magnetron-sputtering method and were studied over square areas of 4.4 lm 9 4.4 lm using AFM and fractal analysis. The 3-D surface morphology revealed the fractal geometry of Cu thin films at nanometer scale, which can be quantitatively estimated by the fractal dimension D f that was determined by cube counting method, based on the linear interpolation type. The results from AFM data indicated the possible presence of superstructures on the growth process of Cu nanostructures that were in relatively good agreement with XRD data and PSD.

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“…Fractal analysis has been successfully used in various fields of science and engineering; moreover, in comparison with the pure statistical analysis, fractal analysis allows us to obtain more information about the surface and its morphology, with low computational time and higher accuracy [17][18][19][20].…”

Section: Introductionmentioning

confidence: 99%

“…The fractal surface is characterized by properties of continuity, non-differentiability, and self-similarity of the structure [20][21][22]. In this way, the specimen is composed of units and sub-units from one level of length scales to another level of smaller length scales, which that are formed with a structure similar than the entire object one by shifting and stretching [23][24][25][26].…”

Section: Introductionmentioning

confidence: 99%

Micromorphology and fractal analysis of nickel–carbon composite thin films

Ţălu

Luna

Ahmadpourian

et al. 2016

J Mater Sci: Mater Electron

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In this study nickel-carbon (Ni-C) nanocomposite thin films composed of Ni nanoparticles with different average sizes embedded in amorphous hydrogenated carbon, were prepared through the combination of radio frequency sputtering and plasma enhanced chemical vapor deposition techniques. Such samples were used as experimental models to study the three dimensional surface morphology properties in thin films by atomic force microscopy imaging and fractal analysis over square areas of 1 μm 9 1 μm. The deposition time was varied at 7, 10 and 13 min, respectively, to study changes in the properties of the obtained films. The studied samples exhibited fractal properties characterized by fractal dimensions dependent on the deposition time with values between 2.43 ± 0.01 and 2.71 ± 0.01.

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Fractal Analysis of AFM Data Characterizing Strongly Isotropic and Anisotropic Surface Topography

Cited by 32 publications

References 6 publications

Application of Atomic Force Microscopy for Studies of Fractal and Functional Properties of Biomaterials

Application of Atomic Force Microscopy for Studies of Fractal and Functional Properties of Biomaterials

Micromorphology characterization of copper thin films by AFM and fractal analysis

Micromorphology and fractal analysis of nickel–carbon composite thin films

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